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121. 
Cover image for Magnetism Materials and Applications
Magnetism Materials and Applications
Author 
Trémolet de Lacheisserie, Étienne. editor. Gignoux, Damien. editor. Schlenker, Michel. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-23063-4
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122. 
Cover image for Photovoltaic Solar Energy Generation
Photovoltaic Solar Energy Generation
Author 
Lotsch, H.K.V. author. Goetzberger, Adolf. author. U.Hoffmann, Volker. author. Rhodes, William T. editor. Asakura, Toshimitsu. editor.
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http://dx.doi.org/10.1007/b137803
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123. 
Cover image for Physical Acoustics in the Solid State
Physical Acoustics in the Solid State
Author 
Lüthi, Bruno. author. Cardona, Manuel. editor. Klitzing, Klaus. editor. Queisser, Hans-Joachim. editor. Fulde, Peter. editor.
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http://dx.doi.org/10.1007/b138867
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124. 
Cover image for Frontiers in Magnetic Materials
Frontiers in Magnetic Materials
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Narlikar, Anant V. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138873
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125. 
Cover image for Frontiers in Superconducting Materials
Frontiers in Superconducting Materials
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Narlikar, Anant V. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138883
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126. 
Cover image for Finite Element Methods and Their Applications
Finite Element Methods and Their Applications
Author 
Chen, Zhangxin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28078-2
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127. 
Cover image for Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
Author 
Giannuzzi, Lucille A. editor. Stevie, Fred A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b101190
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128. 
Cover image for Field Emission in Vacuum Microelectronics
Field Emission in Vacuum Microelectronics
Author 
Fursey, George. author. Brodie, Ivor. editor. Schwoebel, Paul. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139052
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129. 
Cover image for Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Author 
Sikula, Josef. editor. Levinshtein, Michael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-2170-4
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130. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3019-3
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131. 
Cover image for Materials Fundamentals of Gate Dielectrics
Materials Fundamentals of Gate Dielectrics
Author 
Demkov, Alexander A. editor. Navrotsky, Alexandra. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3078-9
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