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421. 
Cover image for Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Author 
Rein, Stefan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-27922-9
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422. 
Cover image for Finite Element Methods and Their Applications
Finite Element Methods and Their Applications
Author 
Chen, Zhangxin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28078-2
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423. 
Cover image for Gettering Defects in Semiconductors
Gettering Defects in Semiconductors
Author 
Perevoschikov, Victor A. author. Skoupov, Vladimir D. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-29499-6
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424. 
Cover image for Semiconductor Nanocrystals and Silicate Nanoparticles
Semiconductor Nanocrystals and Silicate Nanoparticles
Author 
Peng, X. editor. Mingos, D. M. P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b11020
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425. 
Cover image for Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
Author 
Schubert, Mathias. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b11964
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426. 
Cover image for Principles and Applications of NanoMEMS Physics
Principles and Applications of NanoMEMS Physics
Author 
Santos, Héctor J. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136228
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427. 
Cover image for Field Emission in Vacuum Microelectronics
Field Emission in Vacuum Microelectronics
Author 
Fursey, George. author. Brodie, Ivor. editor. Schwoebel, Paul. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139052
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428. 
Cover image for Transaction Level Modeling with SystemC TLM Concepts and Applications for Embedded Systems
Transaction Level Modeling with SystemC TLM Concepts and Applications for Embedded Systems
Author 
Ghenassia, Frank. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137175
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429. 
Cover image for Quantum Dots: Fundamentals, Applications, and Frontiers Proceedings of the NATO Advanced Research Workshop on Quantum Dots: Fundamentals, Applications and Frontiers Crete, Greece, 20–24 July 2003
Quantum Dots: Fundamentals, Applications, and Frontiers Proceedings of the NATO Advanced Research Workshop on Quantum Dots: Fundamentals, Applications and Frontiers Crete, Greece, 20–24 July 2003
Author 
Joyce, Bruce A. editor. Kelires, Pantelis C. editor. Naumovets, Anton G. editor. Vvedensky, Dimitri D. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3315-X
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430. 
Cover image for Springer Handbook of Condensed Matter and Materials Data
Springer Handbook of Condensed Matter and Materials Data
Author 
Martienssen, Werner. editor. Warlimont, Hans. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-30437-1
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