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1. 
Cover image for Verilog and SystemVerilog Gotchas 101 Common Coding Errors and How to Avoid Them
Verilog and SystemVerilog Gotchas 101 Common Coding Errors and How to Avoid Them
Author 
Sutherland, Stuart. author. Mills, Don. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71715-9
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2. 
Cover image for Low Power Methodology Manual For System-on-Chip Design
Low Power Methodology Manual For System-on-Chip Design
Author 
Keating, Michael. author. Flynn, David. author. Aitken, Robert. author. Gibbons, Alan. author. Shi, Kaijian. author.
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http://dx.doi.org/10.1007/978-0-387-71819-4
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3. 
Cover image for Einführung in die Halbleiter-Schaltungstechnik
Einführung in die Halbleiter-Schaltungstechnik
Author 
Göbel, Holger. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-34030-0
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4. 
Cover image for Systemverilog for Verification A Guide to Learning the Testbench Language Features
Systemverilog for Verification A Guide to Learning the Testbench Language Features
Author 
Spear, Chris. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138536
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5. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28133-9
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6. 
Cover image for Applications of Specification and Design Languages for SoCs Selected papers from FDL 2005
Applications of Specification and Design Languages for SoCs Selected papers from FDL 2005
Author 
Vachoux, A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-4998-9
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7. 
Cover image for Fully-Depleted SOI CMOS Circuits and Technology for Ultralow-Power Applications
Fully-Depleted SOI CMOS Circuits and Technology for Ultralow-Power Applications
Author 
Sakurai, Takayasu. author. Matsuzawa, Akira. author. Douseki, Takakuni. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-29218-2
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8. 
Cover image for Interconnect Noise Optimization in Nanometer Technologies
Interconnect Noise Optimization in Nanometer Technologies
Author 
Elgamel, Mohamed A. author. Bayoumi, Magdy A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-29366-3
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9. 
Cover image for Platform Based Design at the Electronic System Level Industry Perspectives and Experiences
Platform Based Design at the Electronic System Level Industry Perspectives and Experiences
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Burton, Mark. author. Morawiec, Adam. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5138-7
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10. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-173-3
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11. 
Cover image for SystemC Kernel Extensions for Heterogeneous System Modeling A framework for Multi-MoC Modeling & Simulation
SystemC Kernel Extensions for Heterogeneous System Modeling A framework for Multi-MoC Modeling & Simulation
Author 
Patel, Hiren D. author. Shukla, Sandeep K. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b117249
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