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97. 
Cover image for Electromagnetic Behaviour of Metallic Wire Structures
Electromagnetic Behaviour of Metallic Wire Structures
Author 
Chui, S. T. author. Zhou, Lei. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(330920.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-4159-4
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98. 
Cover image for Physical Layer Multi-Core Prototyping A Dataflow-Based Approach for LTE eNodeB
Physical Layer Multi-Core Prototyping A Dataflow-Based Approach for LTE eNodeB
Author 
Pelcat, Maxime. author. Aridhi, Slaheddine. author. Piat, Jonathan. author. Nezan, Jean-François. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(330930.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-4210-2
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99. 
Cover image for CESAR - Cost-efficient Methods and Processes for Safety-relevant Embedded Systems
CESAR - Cost-efficient Methods and Processes for Safety-relevant Embedded Systems
Author 
Rajan, Ajitha. editor. Wahl, Thomas. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335322.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-7091-1387-5
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100. 
Cover image for Inside Solid State Drives (SSDs)
Inside Solid State Drives (SSDs)
Author 
Micheloni, Rino. author. Marelli, Alessia. author. Eshghi, Kam. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335898.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-5146-0
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101. 
Cover image for Theory of Digital Automata
Theory of Digital Automata
Author 
Borowik, Bohdan. author. Karpinskyy, Mykola. author. Lahno, Valery. author. Petrov, Oleksandr. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335923.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-5228-3
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102. 
Cover image for Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits
Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits
Author 
Wirnshofer, Martin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336184.1)
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http://dx.doi.org/10.1007/978-94-007-6196-4
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103. 
Cover image for High Mobility and Quantum Well Transistors Design and TCAD Simulation
High Mobility and Quantum Well Transistors Design and TCAD Simulation
Author 
Hellings, Geert. author. De Meyer, Kristin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336218.1)
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http://dx.doi.org/10.1007/978-94-007-6340-1
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104. 
Cover image for Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Author 
Im, Seongil. author. Chang, Youn-Gyoung. author. Kim, Jae Hoon. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336233.1)
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http://dx.doi.org/10.1007/978-94-007-6392-0
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