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13. 
Cover image for Optical bit error rate an estimation methodology
Optical bit error rate an estimation methodology
Author 
Kartalopoulos, Stamatios V.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060
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14. 
Cover image for Measurement error and misclassification in statistics and epidemiology impacts and Bayesian adjustments
Measurement error and misclassification in statistics and epidemiology impacts and Bayesian adjustments
Author 
Gustafson, Paul, 1968-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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15. 
Cover image for Measurement errors in surveys
Measurement errors in surveys
Author 
Biemer, Paul P. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0626/2005270829-b.html
ebrary http://site.ebrary.com/id/10509849
http://site.ebrary.com/lib/alltitles/Doc?id=10509849
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16. 
Cover image for Data reduction and error analysis for the physical sciences
Data reduction and error analysis for the physical sciences
Author 
Bevington, Philip R., 1933- Robinson, D. Keith, ort. yaz.
Preferred Shelf Number 
QA 278 B48 2003
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17. 
Cover image for Data reconciliation & gross error detection an intelligent use of process data
Data reconciliation & gross error detection an intelligent use of process data
Author 
Narasimhan, Shankar. Jordache, Cornelius.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780884152552
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18. 
Cover image for A posteriori error estimation in finite element analysis
A posteriori error estimation in finite element analysis
Author 
Ainsworth, Mark, 1965- Oden, J. Tinsley (John Tinsley), 1936- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/00039915.html
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19. 
Cover image for A unified approach to the finite element method and error analysis procedures
A unified approach to the finite element method and error analysis procedures
Author 
Dow, John O., 1941-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122214400
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20. 
Cover image for Spatial error analysis a unified, application-oriented treatment
Spatial error analysis a unified, application-oriented treatment
Author 
Hsu, David Y., 1945- IEEE Aerospace and Electronic Systems Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273252
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21. 
Cover image for An introduction to error analysis : The study of uncertainties in physical measurements
An introduction to error analysis : The study of uncertainties in physical measurements
Author 
Taylor, John Robert, 1939-
Preferred Shelf Number 
QC 39 T4 1997
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22. 
Cover image for Dengeleme hesabı
Dengeleme hesabı
Author 
Öztürk, Ergün Şerbetçi, Muzaffer.
Preferred Shelf Number 
TA 347.O4 O258 1989
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23. 
Cover image for Spherical Near-field Antenna Measurements
Spherical Near-field Antenna Measurements
Author 
Hansen, J. E., ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBEW026E
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24. 
Cover image for Measurement error models
Measurement error models
Author 
Fuller, Wayne A. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469407
John Wiley http://dx.doi.org/10.1002/9780470316665
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