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121. 
Cover image for Hot deformation and processing of aluminum alloys
Hot deformation and processing of aluminum alloys
Author 
McQueen, H. J.
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122. 
Cover image for Schaum's outline of theory and problems of beginning physics II waves, electromagnetism, optics, and modern physics
Schaum's outline of theory and problems of beginning physics II waves, electromagnetism, optics, and modern physics
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Halpern, Alvin M. Erlbach, Erich.
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123. 
Cover image for Aberration-corrected analytical transmission electron microscopy
Aberration-corrected analytical transmission electron microscopy
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Brydson, Rik, editor, author.
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ONLINE(318971.1)
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John Wiley http://dx.doi.org/10.1002/9781119978848
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124. 
Cover image for Crystals, x-rays and proteins comprehensive protein crystallography
Crystals, x-rays and proteins comprehensive protein crystallography
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Sherwood, Dennis. Cooper, Jon (Jonathan B.)
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125. 
Cover image for Neutron protein crystallography hydrogen, protons, and hydration in bio-macromolecules
Neutron protein crystallography hydrogen, protons, and hydration in bio-macromolecules
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Niimura, Nobuo. Podjarny, A. D. International Union of Crystallography.
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Oxford scholarship online http://dx.doi.org/10.1093/acprof:oso/9780199578863.001.0001
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126. 
Cover image for Biochemical applications of nonlinear optical spectroscopy
Biochemical applications of nonlinear optical spectroscopy
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Yakovlev, Vladislav V.
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127. 
Cover image for Applied digital optics from micro-optics to nanophotonics
Applied digital optics from micro-optics to nanophotonics
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Kress, B. Meyrueis, Patrick. Wiley InterScience (Online service)
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128. 
Cover image for Designer surfaces
Designer surfaces
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Maradudin, A. A. Méndez, Eugenio R. Leskova, Tamara A.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444530486
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129. 
Cover image for Photonics principles and practices
Photonics principles and practices
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Al-Azzawi, Abdul.
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130. 
Cover image for Physical optics principles and practices
Physical optics principles and practices
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Al-Azzawi, Abdul.
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131. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
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Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
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132. 
Cover image for Interferogram analysis for optical testing
Interferogram analysis for optical testing
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Malacara, Daniel, 1937- Servn̕, Manuel. Malacara, Zacarias, 1948-
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