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121. 
Cover image for Process plant equipment operation, control, and reliability
Process plant equipment operation, control, and reliability
Author 
Holloway, Michael D., 1963- Nwaoha, Chikezie, 1984- Onyewuenyi, Oliver A., 1952-
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118162569
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072
John Wiley http://dx.doi.org/10.1002/9781118162569
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122. 
Cover image for Compressors how to achieve high reliability & availability
Compressors how to achieve high reliability & availability
Author 
Bloch, Heinz P., 1933- Geitner, Fred K.
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123. 
Cover image for Lead-free solders materials reliability for electronics
Lead-free solders materials reliability for electronics
Author 
Subramaniam, K. N., Ph. D. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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124. 
Cover image for Reliability of Microtechnology Interconnects, Devices and Systems
Reliability of Microtechnology Interconnects, Devices and Systems
Author 
Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.
Preferred Shelf Number 
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-5760-3
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125. 
Cover image for Hydrosystems engineering reliability assessment and risk analysis
Hydrosystems engineering reliability assessment and risk analysis
Author 
Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.
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126. 
Cover image for Reliability centered maintenance (RCM) implementation made simple
Reliability centered maintenance (RCM) implementation made simple
Author 
Bloom, Neil.
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127. 
Cover image for Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution
Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution
Author 
Levi, Paul. author. Kernbach, Serge. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-3-642-11692-6
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128. 
Cover image for Solder Joint Reliability Prediction for Multiple Environments
Solder Joint Reliability Prediction for Multiple Environments
Author 
Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-79394-8
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129. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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130. 
Cover image for VoIP handbook applications, technologies, reliability, and security
VoIP handbook applications, technologies, reliability, and security
Author 
Ahson, Syed. Ilyas, Mohammad, 1953-
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Distributed by publisher. Purchase or institutional license may be required for access.
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131. 
Cover image for Rules of thumb for maintenance and reliability engineers
Rules of thumb for maintenance and reliability engineers
Author 
Smith, Ricky. Mobley, R. Keith, 1943-
Preferred Shelf Number 
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Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780750678629
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132. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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