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1. 
Cover image for Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
Author 
Epperlein, Peter W.
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506
John Wiley http://dx.doi.org/10.1002/9781118481882
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2. 
Cover image for High-speed photonics interconnects
High-speed photonics interconnects
Author 
Chrostowski, Lukas. Iniewski, Krzysztof.
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3. 
Cover image for Ultrafast laser processing from micro- to nanoscale
Ultrafast laser processing from micro- to nanoscale
Author 
Sugioka, K?ji. Cheng, Ya.
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4. 
Cover image for Polymer processing and characterization
Polymer processing and characterization
Author 
Thomas, Sabu. Ponnamma, Deepalekshmi. Zachariah, Ajesh K.
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5. 
Cover image for Graphite, graphene, and their polymer nanocomposites
Graphite, graphene, and their polymer nanocomposites
Author 
Mukhopadhyay, P. (Prithu) Gupta, Rakesh K. (Rakesh Kumar), 1954-
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6. 
Cover image for Lattice engineering technology and applications
Lattice engineering technology and applications
Author 
Wang, Shumin.
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7. 
Cover image for Ultra-realistic imaging advanced techniques in analogue and digital colour holography
Ultra-realistic imaging advanced techniques in analogue and digital colour holography
Author 
Bjelkhagen, Hans I. Brotherton-Ratcliffe, David.
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8. 
Cover image for Guided wave optics and photonic devices
Guided wave optics and photonic devices
Author 
Bhadra, Shyamal. Ghatak, A. K. (Ajoy K.), 1939-
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9. 
Cover image for Optical materials and applications
Optical materials and applications
Author 
Wakaki, Moriaki.
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10. 
Cover image for Fundamentals of femtosecond optics
Fundamentals of femtosecond optics
Author 
Kozlov, S. A. (Sergeĭ Arkadʹevich), 1956- author. Samartsev, V. V. (Vitaliĭ Vladimirovich) author.
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TA1677 K69 2013
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11. 
Cover image for Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Author 
Boutier, A. (Alain)
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Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118576847
John Wiley http://dx.doi.org/10.1002/9781118576847
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12. 
Cover image for Applied Bohmian mechanics from nanoscale systems to cosmology
Applied Bohmian mechanics from nanoscale systems to cosmology
Author 
Oriols, Xavier. Mompart, Jordi.
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