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Publication Date: 1997

Author

Institute of Electrical and Electronics Engineers.

(2)

American Society for Testing and Materials.

(1)

Baxter, Larry K.

(1)

Bhatnagar, P. K., 1948-

(1)

Blandin, A., ed.

(1)

Bloembergen, N.

(1)

(1)

Cohen-Tannoudji, Claude, 1933-, ed.

(1)

Dewitt-Morette, Cêcile, ed.

(1)

Einspruch, Norman G.

(1)

Grenoble. Universite, Ecole d'ete de Physique Theorique, Les Houches.

(1)

Hart, Daniel W.

(1)

Hawkes, Peter W., ed.

(1)

Herrick, Clyde N.

(1)

IEEE Communications Society.

(1)

IEEE Industrial Electronics Society.

(1)

IEEE Solid-State Circuits Council.

(1)

John Wiley & Sons.

(1)

Mazda, Fraidoon F.

(1)

Mermet, Jean, ed.

(1)

Nebel, Wolfgang, ed.

(1)

Rabin, Herbert.

(1)

Rohde, Ulrich L.

(1)

Sharma, Ashok K.

(1)

Tang, C. L. (Chung Liang), 1934-

(1)

(1)

(1)

Van Trees, Harry L.

(1)

Wheeler, Philip, rev.

(1)

Language

(15)

(1)

(1)

(1)

Subject

Electronic books.

(6)

Power electronics.

(3)

Capteurs (technologie)

(2)

(2)

Electric circuits -- Periodicals.

(2)

Electronics -- Tables.

(2)

(2)

GÜÇ ELEKTRONİĞİ.

(2)

(1)

Capacitance meters -- Design and construction.

(1)

DUSUK VOLTAJLI ENTEGRE DEVRELER -- CIZIM VE YAPIM.

(1)

Digital electronics.

(1)

Dispositifs électromécaniques.

(1)

(1)

ELEKTRİK DEVRELERİ -- DALGALI ALTERNATİF.

(1)

ELEKTRİK MAKİNELERİ.

(1)

Electric driving, Variable speed.

(1)

Electric machinery -- Alternating current.

(1)

Electric machinery.

(1)

Electrical engineering -- Periodicals.

(1)

Electronic industries -- Quality control.

(1)

Electronic instruments -- Design and construction.

(1)

Electronics -- Mathematics.

(1)

Electronics -- Periodicals.

(1)

(1)

Elektrik Elektronik Mühendisliği -- Süreli yayınlar

(1)

Engenharia eletrica e eletronica.

(1)

Estimation theory.

(1)

Frequency synthesizers -- Design and construction.

(1)

GÖRÜNTÜ İŞLEME.

(1)

ISO 9000 Series Standards.

(1)

Image processing.

(1)

Integrated circuits -- Very large scale integration.

(1)

KUANTUM KURAMI.

(1)

METAL OKSIT YARIILETKENLER, TUMLEYICI -- CIZIM VE YAPIM.

(1)

MODÜLASYON (ELEKTRONİK)

(1)

Maquinas eletricas de corrente alternada.

(1)

Metric system -- Standards -- United States.

(1)

Metric system -- Standards.

(1)

Metrik sistem -- Standartlar -- ABD.

(1)

Metrik sistem -- Standartlar.

(1)

Microelectromechanical systems.

(1)

Microelectronics.

(1)

Micromécanique.

(1)

Microwave circuits -- Design and construction.

(1)

Modulation (Electronics)

(1)

Phase-locked loops.

(1)

Power semiconductors.

(1)

Quantum electronics.

(1)

Radio frequency.

(1)

Semiconductor storage devices.

(1)

Signal theory (Telecommunication)

(1)

Synchronous data transmission systems.

(1)

SİNYAL KURAMI (TELEKOMÜNİKASYON)

(1)

TAHMİN KURAMI.

(1)

Électronique -- Instruments -- Conception et construction.

(1)

Material Type

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13.

Cover image for Micromechanics and MEMS classic and seminal papers to 1990

Micromechanics and MEMS classic and seminal papers to 1990

Micromechanics and MEMS classic and seminal papers to 1990

Author

Trimmer, W. Institute of Electrical and Electronics Engineers.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273520

Format:

Availability

Online Library~1

Available:
Copies:

14.

Cover image for Electrical installation calculations

Electrical installation calculations

Electrical installation calculations

Preferred Shelf Number

ONLINE

Electronic Access

Click here to view

Format:

Availability

Online Library~1

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15.

Cover image for Electrical installation calculations

Electrical installation calculations

Electrical installation calculations

Preferred Shelf Number

ONLINE

Electronic Access

Click here to view

Format:

Availability

Online Library~1

Available:
Copies:

16.

Cover image for Advances in imaging and electron physics.

Advances in imaging and electron physics.

Advances in imaging and electron physics.

Author

Hawkes, Peter W., ed.

Preferred Shelf Number

QC 793.5.E62 A3 V.127 2003

Format:

Availability

Beytepe Library~2

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17.

Cover image for Detection, estimation, and modulation theory

Detection, estimation, and modulation theory

Detection, estimation, and modulation theory

Author

Van Trees, Harry L.

Preferred Shelf Number

TK 5102.5 V3 V.3

Format:

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Beytepe Library~2

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18.

Cover image for Microwave and wireless synthesizers theory and design

Microwave and wireless synthesizers theory and design

Microwave and wireless synthesizers theory and design

Author

Rohde, Ulrich L. John Wiley & Sons.

Preferred Shelf Number

ONLINE

Electronic Access

Available by subscription from Safari Books Online
John Wiley http://dx.doi.org/10.1002/0471224316
Volltext http://proquest.tech.safaribooksonline.de/9780471520191

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Online Library~1

Available:
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19.

Cover image for Schaltungstechnik und Funktionsanalyse Energietechnik : Informationsband: Grundbildung und Fachbildung.

Schaltungstechnik und Funktionsanalyse Energietechnik : Informationsband: Grundbildung und Fachbildung.

Schaltungstechnik und Funktionsanalyse Energietechnik : Informationsband: Grundbildung und Fachbildung.

Preferred Shelf Number

TK 2181 S15 1997

Format:

Availability

Beytepe Library~1

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20.

Cover image for Semiconductor memories technology, testing, and reliability

Semiconductor memories technology, testing, and reliability

Semiconductor memories technology, testing, and reliability

Author

Sharma, Ashok K. IEEE Solid-State Circuits Council.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189

Format:

Availability

Online Library~1

Available:
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21.

Cover image for Engineering networks for synchronization, CCS 7, and ISDN standards, protocols, planning, and testing

Engineering networks for synchronization, CCS 7, and ISDN standards, protocols, planning, and testing

Engineering networks for synchronization, CCS 7, and ISDN standards, protocols, planning, and testing

Author

Bhatnagar, P. K., 1948- IEEE Communications Society.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273657

Format:

Availability

Online Library~1

Available:
Copies:

22.

Cover image for Standard for use of the International System of Units (SI) : the modern metric system

Standard for use of the International System of Units (SI) : the modern metric system

Standard for use of the International System of Units (SI) : the modern metric system

Author

American Society for Testing and Materials.

Preferred Shelf Number

QC91 S82 1997

Format:

Availability

Beytepe Library~1

Available:
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1 2

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