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13. 
Cover image for Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability
Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability
Author 
Jahanshahi, Mohsen. author. Bistouni, Fathollah. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-78473-1
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14. 
Cover image for Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedings
Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedings
Author 
Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-99130-6
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15. 
Cover image for Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings
Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings
Author 
Wang, Lei. editor. Qiu, Tie. editor. Zhao, Wenbing. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-78078-8
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16. 
Cover image for Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latvia
Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latvia
Author 
Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-74454-4
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17. 
Cover image for Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability
Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability
Author 
Suganuma, Katsuaki, editor.
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ScienceDirect https://www.sciencedirect.com/science/book/9780081020944
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18. 
Cover image for Risk-Based Engineering An Integrated Approach to Complex Systems—Special Reference to Nuclear Plants
Risk-Based Engineering An Integrated Approach to Complex Systems—Special Reference to Nuclear Plants
Author 
Varde, Prabhakar V. author. Pecht, Michael G. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-0090-5
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19. 
Cover image for Advanced Maintenance Policies for Shock and Damage Models
Advanced Maintenance Policies for Shock and Damage Models
Author 
Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-70456-2
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20. 
Cover image for Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governance
Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governance
Author 
Gheorghe, Adrian V. author. Vamanu, Dan V. author. Katina, Polinpapilinho F. author. Pulfer, Roland. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-69224-1
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21. 
Cover image for Infrastructure health in civil engineering
Infrastructure health in civil engineering
Author 
Ettouney, Mohammed. Alampalli, Sreenivas.
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Distributed by publisher. Purchase or institutional license may be required for access.
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