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Subject: Performance and Reliability.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
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Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-9644-9
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