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13. 
Cover image for Statistical methods for six sigma in R & D and manufacturing
Statistical methods for six sigma in R & D and manufacturing
Author 
Joglekar, Anand M.
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John Wiley http://dx.doi.org/10.1002/0471721212
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2003003583.html
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14. 
Cover image for Statistical process control the Deming paradigm and beyond
Statistical process control the Deming paradigm and beyond
Author 
Thompson, James R., 1938- Koronacki, Jacek.
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