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13. 
Cover image for Design of mechanical systems based on statistics : a guide to improving product reliability
Design of mechanical systems based on statistics : a guide to improving product reliability
Author 
Woo, Seong-woo, author.
Preferred Shelf Number 
TJ245.5
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429022050
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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14. 
Cover image for Maintaining mission critical systems in a 24/7 environment
Maintaining mission critical systems in a 24/7 environment
Author 
Curtis, Peter M., author.
Preferred Shelf Number 
TA169 .C87 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133
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15. 
Cover image for Repairable systems reliability analysis : a comprehensive framework
Repairable systems reliability analysis : a comprehensive framework
Author 
Rai, Rajiv Nandan, author. Chaturvedi, Sanjay K., author. Bolia, Nomesh, author.
Preferred Shelf Number 
QA402 .R35 2020
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582
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16. 
Cover image for Reliability engineering and services
Reliability engineering and services
Author 
Jin, Tongdan, author.
Preferred Shelf Number 
TS173 .J56 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020
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17. 
Cover image for Methods for reliability improvement and risk reduction
Methods for reliability improvement and risk reduction
Author 
Todinov, M. T., author.
Preferred Shelf Number 
TA169 .T649 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624
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18. 
Cover image for Dynamic system reliability : modelling and analysis of dynamic and dependent behaviors
Dynamic system reliability : modelling and analysis of dynamic and dependent behaviors
Author 
Xing, Liudong, author. Levitin, Gregory, author. Wang, Chaonan, 1986- author.
Preferred Shelf Number 
TA169 .X56 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642
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19. 
Cover image for Reliability of maintained systems subjected to wear failure mechanisms : theory and applications
Reliability of maintained systems subjected to wear failure mechanisms : theory and applications
Author 
Bayle, Franck, author.
Preferred Shelf Number 
TA169
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717
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20. 
Cover image for Improving product reliability and software quality : strategies, tools, process and implementation
Improving product reliability and software quality : strategies, tools, process and implementation
Author 
Levin, Mark, 1959- author. Kalal, Ted T., author. Rodin, Jonathan, 1957- author.
Preferred Shelf Number 
TS173 .L48 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429
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21. 
Cover image for Structural reliability analysis and prediction
Structural reliability analysis and prediction
Author 
Melchers, R. E. (Robert E.), 1945- author. Beck, André T., author.
Preferred Shelf Number 
TA656.5 .M45 2018
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105
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22. 
Cover image for Production availability and reliability : use in the oil and gas industry
Production availability and reliability : use in the oil and gas industry
Author 
Leroy, Alain, author.
Preferred Shelf Number 
TA169
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454
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23. 
Cover image for Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Author 
Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.
Preferred Shelf Number 
TA169.5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692
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24. 
Cover image for Design for reliability
Design for reliability
Author 
Raheja, Dev. Gullo, Louis J.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791
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