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13. 
Cover image for Practical analysis of flavor and fragrance materials
Practical analysis of flavor and fragrance materials
Author 
Goodner, Kevin. Rousseff, Russell.
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Electronic Access 
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John Wiley http://dx.doi.org/10.1002/9781444343137
OverDrive (PDF) http://www.contentreserve.com/TitleInfo.asp?ID={291D46BF-FF83-425C-9F55-815F39FF71B3}&Format=50
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14. 
Cover image for Thermal analysis of rubbers and rubbery materials
Thermal analysis of rubbers and rubbery materials
Author 
Choudhury, Namita Roy. De, Prajna P. Dutta, Naba K.
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ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=320088
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15. 
Cover image for Handbook of thermal analysis of construction materials
Handbook of thermal analysis of construction materials
Author 
Ramachandran, V. S. (Vangipuram Seshachar)
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ScienceDirect http://www.sciencedirect.com/science/book/9780815514879
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16. 
Cover image for Handbook of thermal analysis of construction materials
Handbook of thermal analysis of construction materials
Author 
Ramachandran, Vangipuram Seshachar, ed.
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TA 418.52 H36 2002
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17. 
Cover image for Applications of synchrotron radiation to materials analysis
Applications of synchrotron radiation to materials analysis
Author 
Saisho, H. (Hideo) Gohshi, Y. (Yohichi)
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ScienceDirect http://www.sciencedirect.com/science/book/9780444888570
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18. 
Cover image for Materials analysis by ion channeling submicron crystallography
Materials analysis by ion channeling submicron crystallography
Author 
Feldman, Leonard C. Mayer, James W., 1930- Picraux, S. T., 1943-
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ScienceDirect http://www.sciencedirect.com/science/book/9780122526800
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19. 
Cover image for Finite element analysis of composite materials using Abaqus
Finite element analysis of composite materials using Abaqus
Author 
Barbero, Ever J.
Preferred Shelf Number 
TA418.9.C6 B3685 2013
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20. 
Cover image for Finite element analysis of composite materials using Abaqus
Finite element analysis of composite materials using Abaqus
Author 
Barbero, Ever J.
Preferred Shelf Number 
ONLINE(312865.1)
Electronic Access 
Knovel http://app.knovel.com/web/toc.v/cid:kpFEACMUA1
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21. 
Cover image for Econometric analysis of cross section and panel data : Student's solutions manual and supplementary materials for Econometric analysis of cross section and panel data
Econometric analysis of cross section and panel data : Student's solutions manual and supplementary materials for Econometric analysis of cross section and panel data
Author 
Wooldridge, Jeffrey M.
Preferred Shelf Number 
HB139 W663 2011
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22. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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23. 
Cover image for Modeling High Temperature Materials Behavior for Structural Analysis Part II. Solution Procedures and Structural Analysis Examples
Modeling High Temperature Materials Behavior for Structural Analysis Part II. Solution Procedures and Structural Analysis Examples
Author 
Naumenko, Konstantin. author. Altenbach, Holm. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-20381-8
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24. 
Cover image for Advances in Mechanics of Materials and Structural Analysis In Honor of Reinhold Kienzler
Advances in Mechanics of Materials and Structural Analysis In Honor of Reinhold Kienzler
Author 
Altenbach, Holm. editor. Jablonski, Frank. editor. Müller, Wolfgang H. editor. Naumenko, Konstantin. editor. Schneider, Patrick. editor.
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https://doi.org/10.1007/978-3-319-70563-7
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