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13. 
Cover image for Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Author 
Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-28668-6
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14. 
Cover image for Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-37316-2
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15. 
Cover image for Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/11785705
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16. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-37231-8
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17. 
Cover image for Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b139097
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18. 
Cover image for Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Author 
Kaupp, Gerd. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-28472-7
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19. 
Cover image for Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Route to Femtosecond Ångstrom Technology
Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Route to Femtosecond Ångstrom Technology
Author 
Yamashita, Mikio. editor. Shigekawa, Hidemi. editor. Morita, Ryuji. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138671
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