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13. 
Cover image for QoS and QoE management in UMTS cellular systems
QoS and QoE management in UMTS cellular systems
Author 
Soldani, David. Li, Man. Cuny, Renaud.
Preferred Shelf Number 
ONLINE
Electronic Access 
MyiLibrary, Table of contents http://www.myilibrary.com?id=73976&ref=toc
http://www3.interscience.wiley.com/cgi-bin/bookhome/113452822/ProductInformation.html
Volltext http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780470034057
John Wiley http://dx.doi.org/10.1002/9780470034057
Volltext http://onlinelibrary.wiley.com/book/10.1002/9780470034057
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14. 
Cover image for Simulation-based lean six-sigma and design for six-sigma
Simulation-based lean six-sigma and design for six-sigma
Author 
El-Haik, Basem. Al-Aomar, Raid.
Preferred Shelf Number 
ONLINE
Electronic Access 
Click for information
Books24x7 http://www.books24x7.com/marc.asp?bookid=16837
John Wiley http://dx.doi.org/10.1002/0470047720
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15. 
Cover image for Software engineering quality practices
Software engineering quality practices
Author 
Kandt, Ronald Kirk.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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16. 
Cover image for A practical guide to quality management in clinical trial research
A practical guide to quality management in clinical trial research
Author 
Ogg, Graham D.
Preferred Shelf Number 
ONLINE
Electronic Access 
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17. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
Preferred Shelf Number 
ONLINE
Electronic Access 
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18. 
Cover image for Wastewater quality monitoring and treatment
Wastewater quality monitoring and treatment
Author 
Quevauviller, Ph. Thomas, Olivier. Beken, André van der.
Preferred Shelf Number 
ONLINE
Electronic Access 
Books24x7 http://www.books24x7.com/marc.asp?bookid=18008
John Wiley http://dx.doi.org/10.1002/9780470058725
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19. 
Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
Author 
Collège français de métrologie. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
John Wiley http://dx.doi.org/10.1002/9780470612125
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20. 
Cover image for Fundamentals of spatial data quality
Fundamentals of spatial data quality
Author 
Devillers, Rodolphe. Jeansoulin, Robert. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0702/2006009298-b.html
John Wiley http://dx.doi.org/10.1002/9780470612156
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21. 
Cover image for Distribution reliability and power quality
Distribution reliability and power quality
Author 
Short, T. A. (Tom A.), 1966-
Preferred Shelf Number 
ONLINE
Electronic Access 
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22. 
Cover image for Essentials of lean six sigma
Essentials of lean six sigma
Author 
Taghizadegan, Salman, 1957-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123705020
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23. 
Cover image for Journey to data quality
Journey to data quality
Author 
Lee, Yang W.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267297
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24. 
Cover image for Concurrent engineering in construction projects
Concurrent engineering in construction projects
Author 
Anumba, C. J. (Chimay J.) Kamara, John M. Cutting-Decelle, Anne-Francoise.
Preferred Shelf Number 
TH438 .C638 2006
Format: 
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