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13. 
Cover image for Signal analysis time, frequency, scale, and structure
Signal analysis time, frequency, scale, and structure
Author 
Allen, Ronald L. Mills, Duncan W. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237149
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14. 
Cover image for Random processes filtering, estimation, and detection
Random processes filtering, estimation, and detection
Author 
Ludeman, Lonnie C.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5271182
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15. 
Cover image for Signal integrity effects in custom IC and ASIC designs
Signal integrity effects in custom IC and ASIC designs
Author 
Singh, Raminderpal.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273263
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