Search Results for Integrated circuits--Testing.

|

|

|

|

Remember to clear the cache and close the browser window.

Search Limit

Rooms Restriction Values

8

Search Field

Target Value

Limit Value

Restriction Value

Search For:

Advanced Search

Limit Search Results

Narrowed by:

+

Library: Online Library

Author

Wang, Laung-Terng.

(2)

Abramovici, Miron.

(1)

(1)

Bakir, Muhannad S., editor.

(1)

Breuer, Melvin A.

(1)

(1)

Chakrabarty, Krishnendu, editor of compilation.

(1)

Chen, Wai-Kai, 1936-

(1)

Domingo, George, 1937- author.

(1)

Dorf, Richard C., author

(1)

Dorf, Richard C., editor.

(1)

Franzon, Paul D., editor.

(1)

Friedman, Arthur D.

(1)

Frobenius, Rex.

(1)

Goel, Sandeep K, editor of compilation.

(1)

Heyman, Joseph S.

(1)

Huang, Wei, editor.

(1)

Hurst, Stanley L.

(1)

IEEE Circuits and Systems Society.

(1)

(1)

Lidow, Alex, author.

(1)

Machado, Gerson A. S., ed.

(1)

Marinissen, Eric Jan, editor.

(1)

Meng, Hong, editor.

(1)

Oklobdzija, Vojin G.

(1)

Oklobdzija, Vojin G., author.

(1)

Pineda de Gyvez, José.

(1)

Pradhan, Dhiraj K.

(1)

Puers, R., editor.

(1)

Ramaswami, Sesh.

(1)

Russell, Gordon, ed.

(1)

Scott, Allan W.

(1)

Sharma, Rohit, editor.

(1)

Stroud, Charles E.

(1)

Taylor, Gaynor, ed.

(1)

(1)

Voldman, Steven H.

(1)

Wang, Albert Z. H., 1962- author.

(1)

Wang, Francis C.

(1)

(1)

Whitaker, Jerry C.

(1)

Wiley InterScience (Online service)

(1)

(1)

Wu, Cheng-Wen, EE Ph. D.

(1)

Yichuang Sun, ed.

(1)

Zurawski, Richard.

(1)

Language

(25)

Publication Date

-

(4)

(3)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Electronic books.

(6)

Integrated circuits--Testing.

(4)

Application-specific integrated circuits.

(3)

(3)

Integrated circuits -- Testing.

(3)

Computer engineering.

(2)

Digital integrated circuits -- Testing.

(2)

Electrostatics.

(2)

Integrated circuits -- Protection.

(2)

Integrated circuits -- Very large scale integration -- Design.

(2)

Integrated circuits -- Very large scale integration -- Testing.

(2)

Integrated circuits--Very large scale integration.

(2)

Linear integrated circuits.

(2)

TECHNOLOGY & ENGINEERING -- Mechanical.

(2)

TECHNOLOGY & ENGINEERING.

(2)

(2)

Three-dimensional integrated circuits.

(2)

(1)

Cell phones -- Equipment and supplies -- Design and construction.

(1)

Circuits intégrés -- Conception et construction.

(1)

Circuits intégrés -- Protection.

(1)

(1)

(1)

Digital electronics.

(1)

Digital integrated circuits -- Design and construction.

(1)

Digital integrated circuits.

(1)

Digitalschaltung.

(1)

Discrete cosine transforms.

(1)

Electric circuit analysis.

(1)

Electric discharges -- Prevention.

(1)

Electric discharges.

(1)

Electrical engineering.

(1)

Electronic apparatus and appliances

(1)

Electronic apparatus and appliances -- Design and construction.

(1)

Electronic apparatus and appliances.

(1)

Electronic circuits--Testing.

(1)

Electronic digital computers.

(1)

Electronic packaging.

(1)

(1)

(1)

Embedded computer systems -- Handbooks, manuals, etc.

(1)

Expert systems (Computer science).

(1)

Field-effect transistors.

(1)

Gallium nitride.

(1)

Guides et manuels.

(1)

(1)

Handbooks and manuals

(1)

Handbooks and manuals.

(1)

Imagerie tridimensionnelle -- Guides, manuels, etc.

(1)

Integrated circuit layout.

(1)

Integrated circuits -- Computer-aided design.

(1)

Integrated circuits -- Design and construction

(1)

Integrated circuits -- Design and construction.

(1)

Integrated circuits -- Protection

(1)

Integrated circuits -- Reliability -- Congresses.

(1)

Integrated circuits -- Reliability.

(1)

Integrated circuits -- Testing -- Congresses.

(1)

Integrated circuits -- Very large scale integration.

(1)

Integrated circuits industry.

(1)

Integrated circuits--Computer-aided design.

(1)

Integrated circuits--Design and construction.

(1)

Integrated circuits--Reliability.

(1)

Integrated circuits.

(1)

Internet Resources.

(1)

Logic circuits--Computer-aided design.

(1)

(1)

Low voltage integrated circuits.

(1)

Mathematical models.

(1)

Metal oxide semiconductors, Complementary -- Computer-aided design.

(1)

Metal oxide semiconductors, Complementary -- Testing.

(1)

Microelectronic packaging.

(1)

Microelectronics.

(1)

Mise sous boîtier (Électronique)

(1)

Multichip modules (Microelectronics)

(1)

Nanoelectronics

(1)

Nanoelectronics.

(1)

Nanotechnologie.

(1)

(1)

Nanotechnology.

(1)

Nanoélectronique.

(1)

Nitrure de gallium.

(1)

Nondestructive testing -- Congresses.

(1)

Power electronics.

(1)

Power transistors.

(1)

Production engineering.

(1)

Radio frequency integrated circuits -- Testing.

(1)

Radio frequency integrated circuits.

(1)

Semi-conducteurs.

(1)

(1)

Semiconductors -- Design and construction.

(1)

Semiconductors -- Failures.

(1)

Semiconductors -- Testing.

(1)

Semiconductors.

(1)

Signal processing.

(1)

Simulated annealing (Mathematics).

(1)

Solid state electronics

(1)

Solid state electronics.

(1)

Static eliminators

(1)

Static eliminators.

(1)

Systems on a chip -- Testing.

(1)

Systems on a chip.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

Test circuit intégré

(1)

(1)

Three-dimensional imaging

(1)

Three-dimensional imaging -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Computer-aided design.

(1)

Three-dimensional integrated circuits -- Design and construction -- Handbooks, manuals, etc.

(1)

Three-dimensional integrated circuits -- Design and construction.

(1)

Three-dimensional integrated circuits -- Testing.

(1)

Transistors de puissance.

(1)

Transistors à effet de champ.

(1)

(1)

Wireless communication systems -- Equipment and supplies -- Design and construction.

(1)

antistatic agent.

(1)

electronic engineering.

(1)

(1)

(1)

Électronique de l'état solide.

(1)

(1)

Material Type

Shelf Location

Electronic Library

Wiley E-Book Collection

{sortLabel}

	{facetName}	{results}

	{displayName}	{count}
{error}

Switch to list view

Switch to thumbnail view

Select an Action

Place Hold(s)
Add to My Lists
Email
Print

28 Results Found

Subscribe to search results

1 2 3

000000000000DEFAULT

Print

Select a list

Make this your default list.

The following items were successfully added.

There was an error while adding the following items. Please try again.

One or more items could not be added because you are not logged in.

1.

Cover image for Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Author

Yichuang Sun, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS019E

Format:

Availability

Online Library~1

Available:
Copies:

2.

Cover image for RF measurements for cellular phones and wireless data systems

RF measurements for cellular phones and wireless data systems

RF measurements for cellular phones and wireless data systems

Author

Scott, Allan W. Frobenius, Rex.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014

Format:

Availability

Online Library~1

Available:
Copies:

3.

Cover image for Digital design and fabrication

Digital design and fabrication

Digital design and fabrication

Author

Oklobdzija, Vojin G.

Preferred Shelf Number

TK7885 .D54 2008

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

4.

Cover image for The VLSI handbook

The VLSI handbook

The VLSI handbook

Author

Chen, Wai-Kai, 1936-

Preferred Shelf Number

TK7874.75 .V573 2007

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

5.

Cover image for VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

VLSI test principles and architectures design for testability

Author

Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780123705976

Format:

Availability

Online Library~1

Available:
Copies:

6.

Cover image for Microelectronics

Microelectronics

Microelectronics

Author

Whitaker, Jerry C.

Preferred Shelf Number

TK7874 .M4587 2006

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

7.

Cover image for Embedded systems handbook

Embedded systems handbook

Embedded systems handbook

Author

Zurawski, Richard.

Preferred Shelf Number

TK7895 .E42 E64 2006

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

8.

Cover image for The Computer Engineering Handbook.

The Computer Engineering Handbook.

The Computer Engineering Handbook.

Author

Oklobdzija, Vojin G., author. CRC Press LLC.

Preferred Shelf Number

TK7885 .C645 2002

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9781420041545
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Availability

Online Library~1

Available:
Copies:

9.

Cover image for Integrated circuit manufacturability the art of process and design integration

Integrated circuit manufacturability the art of process and design integration

Integrated circuit manufacturability the art of process and design integration

Author

Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097

Format:

Availability

Online Library~1

Available:
Copies:

10.

Cover image for VLSI Testing Digital and mixed analogue/digital techniques

VLSI Testing Digital and mixed analogue/digital techniques

VLSI Testing Digital and mixed analogue/digital techniques

Author

Hurst, Stanley L.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS009E

Format:

Availability

Online Library~1

Available:
Copies:

11.

Cover image for Low-power HF Microelectronics A unified approach

Low-power HF Microelectronics A unified approach

Low-power HF Microelectronics A unified approach

Author

Machado, Gerson A. S., ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS008E

Format:

Availability

Online Library~1

Available:
Copies:

12.

Cover image for Principles of semiconductor network testing

Principles of semiconductor network testing

Principles of semiconductor network testing

Author

Afshar, Amir.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750694728

Format:

Availability

Online Library~1

Available:
Copies:

Select an Action

Place Hold(s)
Add to My Lists
Email
Print

1 2 3

Copyright 2018 Sirsi Corporation - Enterprise Version 5.0.0.11