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1. 
Cover image for Design for Manufacturability and Yield for Nano-Scale CMOS
Design for Manufacturability and Yield for Nano-Scale CMOS
Author 
Chiang, Charles C. author. Kawa, Jamil. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-5188-3
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2. 
Cover image for Functional Verification of Programmable Embedded Architectures A Top-Down Approach
Functional Verification of Programmable Embedded Architectures A Top-Down Approach
Author 
Mishra, Prabhat. author. Dutt, Nikil D. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137514
Format: 
Availability 
Online Library~1
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