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13. 
Cover image for Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Author 
Samukawa, Seiji. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-54795-2
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14. 
Cover image for Light-Emitting Diodes Materials, Processes, Devices and Applications
Light-Emitting Diodes Materials, Processes, Devices and Applications
Author 
Li, Jinmin. editor. Zhang, G. Q. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-99211-2
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15. 
Cover image for FIB Nanostructures
FIB Nanostructures
Author 
Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332951.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02874-3
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16. 
Cover image for Toward Quantum FinFET
Toward Quantum FinFET
Author 
Han, Weihua. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332897.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02021-1
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17. 
Cover image for Quantum dot lasers
Quantum dot lasers
Author 
Ustinov, Victor M. (Victor Mikhailovich)
Preferred Shelf Number 
ONLINE
Electronic Access 
Oxford scholarship online http://dx.doi.org/10.1093/acprof:oso/9780198526797.001.0001
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18. 
Cover image for Bismuth-Containing Compounds
Bismuth-Containing Compounds
Author 
Li, Handong. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332391.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-8121-8
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19. 
Cover image for Three Dimensional Solar Cells Based on Optical Confinement Geometries
Three Dimensional Solar Cells Based on Optical Confinement Geometries
Author 
Li, Yuan. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331840.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-5699-5
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20. 
Cover image for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Author 
van Schooten, Kipp. author. SpringerLink (Online service)
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ONLINE(332776.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00590-4
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21. 
Cover image for Semiconductor device-based sensors for gas, chemical, and bio applications
Semiconductor device-based sensors for gas, chemical, and bio applications
Author 
Ren, Fan. Pearton, S. J.
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ONLINE
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Distributed by publisher. Purchase or institutional license may be required for access.
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22. 
Cover image for CMOS biomicrosystems where electronics meet biology
CMOS biomicrosystems where electronics meet biology
Author 
Iniewski, Krzysztof, 1960- Wiley InterScience (Online service)
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5988887
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5988887
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23. 
Cover image for Managing power electronics VLSI and DSP-driven computer systems
Managing power electronics VLSI and DSP-driven computer systems
Author 
Rossetti, Nazzareno, 1951-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236490
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