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13. 
Cover image for Passive and Active Measurement 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011. Proceedings
Passive and Active Measurement 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011. Proceedings
Author 
Spring, Neil. editor. Riley, George F. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-19260-9
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14. 
Cover image for Performance Evaluation, Measurement and Characterization of Complex Systems Second TPC Technology Conference, TPCTC 2010, Singapore, September 13-17, 2010. Revised Selected Papers
Performance Evaluation, Measurement and Characterization of Complex Systems Second TPC Technology Conference, TPCTC 2010, Singapore, September 13-17, 2010. Revised Selected Papers
Author 
Nambiar, Raghunath. editor. Poess, Meikel. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-18206-8
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15. 
Cover image for Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 15th International GI/ITG Conference, MMB&DFT 2010, Essen, Germany, March 15-17, 2010. Proceedings
Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 15th International GI/ITG Conference, MMB&DFT 2010, Essen, Germany, March 15-17, 2010. Proceedings
Author 
Müller-Clostermann, Bruno. editor. Echtle, Klaus. editor. Rathgeb, Erwin P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-12104-3
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16. 
Cover image for Passive and Active Measurement 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010. Proceedings
Passive and Active Measurement 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010. Proceedings
Author 
Krishnamurthy, Arvind. editor. Plattner, Bernhard. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-12334-4
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17. 
Cover image for Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Author 
Abran, Alain. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Cuadrado-Gallego, Juan J. editor. Brunekreef, Jacob. editor.
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http://dx.doi.org/10.1007/978-3-642-05415-0
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18. 
Cover image for The IT Measurement Compendium Estimating and Benchmarking Success with Functional Size Measurement
The IT Measurement Compendium Estimating and Benchmarking Success with Functional Size Measurement
Author 
Bundschuh, Manfred. author. Dekkers, Carol. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-68188-5
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19. 
Cover image for Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers
Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers
Author 
Cuadrado-Gallego, Juan J. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Abran, Alain. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-85553-8
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20. 
Cover image for Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Author 
Dumke, Reiner R. editor. Braungarten, René. editor. Büren, Günter. editor. Abran, Alain. editor. Cuadrado-Gallego, Juan J. editor.
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http://dx.doi.org/10.1007/978-3-540-89403-2
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21. 
Cover image for Best Practices in Software Measurement How to use metrics to improve project and process performance
Best Practices in Software Measurement How to use metrics to improve project and process performance
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Ebert, Christof. author. Bundschuh, Manfred. author. Dumke, Reiner. author. Schmietendorf, Andreas. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138013
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22. 
Cover image for Systems Benchmarking For Scientists and Engineers
Systems Benchmarking For Scientists and Engineers
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Kounev, Samuel. author. Lange, Klaus-Dieter. author. von Kistowski, Jóakim. author. (orcid)0000-0002-3046-5373 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-85634-1
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23. 
Cover image for Advances in Conceptual Modeling ER 2024 Workshops, AISA, CMLS, EmpER, QUAMES, JUSMOD, LLM4Modeling, Pittsburgh, PA, USA, October 28-31, 2024, Proceedings
Advances in Conceptual Modeling ER 2024 Workshops, AISA, CMLS, EmpER, QUAMES, JUSMOD, LLM4Modeling, Pittsburgh, PA, USA, October 28-31, 2024, Proceedings
Author 
Saeki, Motoshi. editor. Wong, Leah. editor. Araujo, João. editor. (orcid)0000-0001-5914-1631 Ayora, Clara. editor. (orcid)0009-0002-8265-6531 Bernasconi, Anna. editor. (orcid)0000-0001-8016-5750
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https://doi.org/10.1007/978-3-031-75599-6
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24. 
Cover image for Quantum Software Aspects of Theory and System Design
Quantum Software Aspects of Theory and System Design
Author 
Exman, Iaakov. editor. (orcid)0000-0002-9917-3950 Pérez-Castillo, Ricardo. editor. (orcid)0000-0002-9271-3184 Piattini, Mario. editor. (orcid)0000-0002-7212-8279 Felderer, Michael. editor. (orcid)0000-0003-3818-4442 SpringerLink (Online service)
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