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13. 
Cover image for Principles of the Spin Model Checker
Principles of the Spin Model Checker
Author 
Ben-Ari, Mordechai. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84628-770-1
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14. 
Cover image for Applications and Theory of Petri Nets 29th International Conference, PETRI NETS 2008, Xi’an, China, June 23-27, 2008. Proceedings
Applications and Theory of Petri Nets 29th International Conference, PETRI NETS 2008, Xi’an, China, June 23-27, 2008. Proceedings
Author 
Hee, Kees M. editor. Valk, Rüdiger. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-68746-7
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15. 
Cover image for Do-All Computing in Distributed Systems Cooperation in the Presence of Adversity
Do-All Computing in Distributed Systems Cooperation in the Presence of Adversity
Author 
Georgiou, Chryssis. author. Shvartsman, Alexander A. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-69045-2
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16. 
Cover image for Petri Nets and Other Models of Concurrency – ICATPN 2007 28th International Conference on Applications and Theory of Petri Nets and Other Models of Concurrency, ICATPN 2007, Siedlce, Poland, June 25-29, 2007. Proceedings
Petri Nets and Other Models of Concurrency – ICATPN 2007 28th International Conference on Applications and Theory of Petri Nets and Other Models of Concurrency, ICATPN 2007, Siedlce, Poland, June 25-29, 2007. Proceedings
Author 
Kleijn, Jetty. editor. Yakovlev, Alex. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-73094-1
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17. 
Cover image for Embedded signal processing with the Micro Signal Architecture
Embedded signal processing with the Micro Signal Architecture
Author 
Gan, Woon-Seng. Kuo, Sen M. (Sen-Maw)
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237473
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18. 
Cover image for Elements of quantum information
Elements of quantum information
Author 
Schleich, Wolfgang. Walther, H. (Herbert), 1935-2006. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527611065
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19. 
Cover image for Lectures on quantum information
Lectures on quantum information
Author 
Bruss, Dagmar. Leuchs, Gerd. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9783527618637
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20. 
Cover image for Model-based signal processing
Model-based signal processing
Author 
Candy, J. V.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238083
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21. 
Cover image for Petri Nets and Other Models of Concurrency - ICATPN 2006 27th International Conference on Applications and Theory of Petri Nets and Other Models of Concurrency, Turku, Finland, June 26-30, 2006. Proceedings
Petri Nets and Other Models of Concurrency - ICATPN 2006 27th International Conference on Applications and Theory of Petri Nets and Other Models of Concurrency, Turku, Finland, June 26-30, 2006. Proceedings
Author 
Donatelli, Susanna. editor. Thiagarajan, P. S. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/11767589
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22. 
Cover image for Applications and Theory of Petri Nets 2005 26th International Conference, ICATPN 2005, Miami, USA, June 20-25, 2005. Proceedings
Applications and Theory of Petri Nets 2005 26th International Conference, ICATPN 2005, Miami, USA, June 20-25, 2005. Proceedings
Author 
Ciardo, Gianfranco. editor. Darondeau, Philippe. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/b136988
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23. 
Cover image for Quantum computation and quantum information
Quantum computation and quantum information
Author 
Nielsen, Michael A. 1974- Chuang, Isaac L., 1968-
Preferred Shelf Number 
QA76.889 N54 2005
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24. 
Cover image for Testing for EMC compliance approaches and techniques
Testing for EMC compliance approaches and techniques
Author 
Montrose, Mark I. Nakauchi, Edward M.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008
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