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Author

Kalbfleisch, J. D.

(3)

Allison, Paul D.

(2)

Crowder, M. J. (Martin J.), 1943-

(2)

SpringerLink (Online service)

(2)

Chen, Ding-Geng.

(1)

Chen, Ming-Hui, 1961-

(1)

Crowder, Martin J., 1943-

(1)

Fleming, Thomas R.

(1)

Harrington, David P.

(1)

Huber, Catherine.

(1)

Ibrahim, Joseph George.

(1)

John Wiley & Sons.

(1)

Kalbfleich, J. D.

(1)

Kalbfleisch, R. L., ort. yaz.

(1)

Lawless, Jerald F., 1944-

(1)

(1)

Nelson, Wayne, 1936-

(1)

Peace, Karl E., 1941-

(1)

(1)

Preatice, R. L., ort. yaz.

(1)

Prentice, R. L., ort. yaz.

(1)

Prentice, Ross L.

(1)

Prentice, Ross L., ort. yaz.

(1)

Sinha, Debajyoti.

(1)

Spizzichino, F. (Fabio), 1948-

(1)

Sun, Jianguo, 1961-

(1)

Sun, Jianguo. author.

(1)

(1)

Tricker, Samantha.

(1)

Wang, John Wenyu.

(1)

Wen, Shiping. editor.

(1)

Wienke, Andreas.

(1)

Wiley InterScience (Online service)

(1)

Yang, Cihui. editor.

(1)

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Subject

Failure time data analysis.

(14)

Survival analysis (Biometry)

(5)

Competing risks.

(3)

Başarısızlık süresi verilerinin analizi -- Veri işlem.

(2)

Electronic books.

(2)

Failure time data analysis -- Data processing.

(2)

Regression analysis.

(2)

SAS (Bilgisayar kütüğü)

(2)

SAS (Computer file)

(2)

Survival analysis (Biometry) -- Data processing.

(2)

Yaşam analizleri (Biyometri) -- Veri işlem.

(2)

Accelerated life testing -- Statistical methods.

(1)

Accelerated life testing.

(1)

BAŞARISIZLIK SÜRESİ VERİLERİNİN ANALİZİ

(1)

BAŞARISIZLIK SÜRESİ VERİLERİNİN ANALİZİ.

(1)

BAŞARISIZLIK SÜRESİ VERİMLERİNİN ÇÖZÜMLENMESİ.

(1)

Başarısızlık süresi verilerinin analizi.

(1)

Clinical trials -- Statistical methods.

(1)

Demography -- Mathematics.

(1)

Electric apparatus and appliances -- Testing.

(1)

Electric machinery -- Testing.

(1)

Electromechanical devices -- Environmental aspects.

(1)

Electromechanical devices -- Specifications.

(1)

Electronic apparatus and appliances -- Environmental aspects.

(1)

Electronic apparatus and appliances -- Specifications.

(1)

Electronic apparatus and appliances -- Testing.

(1)

Electronic books

(1)

Environmental engineering -- Standards.

(1)

Environmental testing -- Standards.

(1)

Failure time data analysis -- Mathematics.

(1)

Failure time data analysis -- Standards.

(1)

Martingales (Mathematics)

(1)

Medicine -- Research -- Statistical methods.

(1)

Models, Statistical.

(1)

Mortality -- Mathematical models.

(1)

Multivariate analysis.

(1)

Point processes.

(1)

(1)

Prognosis -- Statistical methods.

(1)

REGRESYON ANALİZİ.

(1)

Regresyon analizi.

(1)

Reliability (Engineering)

(1)

Reliability (Engineering) -- Statistical methods.

(1)

(1)

Survival Analysis.

(1)

Survival analysis (Biometry) -- Mathematics.

(1)

Yaşam analizleri (Biyometri)

(1)

Material Type

Shelf Location

Beytepe General Collection

Electronic Library

Sağlık Bilimleri Genel Koleksiyon

Library

Beytepe Library

Health Sciences Library

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13.

Cover image for Accelerated testing and validation testing, engineering, and management tools for lean development

Accelerated testing and validation testing, engineering, and management tools for lean development

Accelerated testing and validation testing, engineering, and management tools for lean development

Author

Porter, Alex.

Preferred Shelf Number

ONLINE

Electronic Access

Volltext http://www.sciencedirect.com/science/book/9780750676533

Format:

Availability

Online Library~1

Available:
Copies:

14.

Cover image for Statistical models and methods for lifetime data

Statistical models and methods for lifetime data

Statistical models and methods for lifetime data

Author

Lawless, Jerald F., 1944-

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9781118033005
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html

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Online Library~1

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15.

Cover image for Statistical methods for survival data analysis

Statistical methods for survival data analysis

Statistical methods for survival data analysis

Author

Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/0471458546
http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html

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Online Library~1

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16.

Cover image for Subjective probability models for lifetimes

Subjective probability models for lifetimes

Subjective probability models for lifetimes

Author

Spizzichino, F. (Fabio), 1948-

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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Online Library~1

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17.

Cover image for Classical competing risks

Classical competing risks

Classical competing risks

Author

Crowder, M. J. (Martin J.), 1943-

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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Online Library~1

Available:
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18.

Cover image for Bayesian survival analysis

Bayesian survival analysis

Bayesian survival analysis

Author

Ibrahim, Joseph George. Chen, Ming-Hui, 1961- Sinha, Debajyoti.

Preferred Shelf Number

QA 276 I27 2001

Format:

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Beytepe Library~1

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19.

Cover image for Classical competing risks

Classical competing risks

Classical competing risks

Author

Crowder, Martin J., 1943-

Preferred Shelf Number

QA 273 C855 2001

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20.

Cover image for Environmental requirements for electromechanical and electronic equipment

Environmental requirements for electromechanical and electronic equipment

Environmental requirements for electromechanical and electronic equipment

Author

Tricker, Ray. Tricker, Samantha.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750639026

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Online Library~1

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21.

Cover image for Survival analysis using the SAS system : a practical guide

Survival analysis using the SAS system : a practical guide

Survival analysis using the SAS system : a practical guide

Author

Allison, Paul D.

Preferred Shelf Number

QA276.4 A394 1995

Format:

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Beytepe Library~1

Available:
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22.

Cover image for Accelerated testing statistical models, test plans and data analyses

Accelerated testing statistical models, test plans and data analyses

Accelerated testing statistical models, test plans and data analyses

Author

Nelson, Wayne, 1936-

Preferred Shelf Number

ONLINE

Electronic Access

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757
John Wiley http://dx.doi.org/10.1002/9780470316795
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html

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