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13. 
Cover image for Low-power HF Microelectronics A unified approach
Low-power HF Microelectronics A unified approach
Author 
Machado, Gerson A. S., ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS008E
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14. 
Cover image for Principles of semiconductor network testing
Principles of semiconductor network testing
Author 
Afshar, Amir.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780750694728
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15. 
Cover image for Algorithmic and Knowledge-based CAD for VLSI
Algorithmic and Knowledge-based CAD for VLSI
Author 
Taylor, Gaynor, ed. Russell, Gordon, ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS004E
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16. 
Cover image for Digital circuit testing a guide to DFT and other techniques
Digital circuit testing a guide to DFT and other techniques
Author 
Wang, Francis C.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780127345802
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17. 
Cover image for Digital systems testing and testable design
Digital systems testing and testable design
Author 
Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057
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18. 
Cover image for Electronics reliability and measurement technology nondestructive evaluation
Electronics reliability and measurement technology nondestructive evaluation
Author 
Heyman, Joseph S.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780815511717
Format: 
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