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Goodner, Kevin. Rousseff, Russell.
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John Wiley http://dx.doi.org/10.1002/9781444343137
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John Wiley http://dx.doi.org/10.1002/9781444343137
OverDrive (PDF) http://www.contentreserve.com/TitleInfo.asp?ID={291D46BF-FF83-425C-9F55-815F39FF71B3}&Format=50
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Choudhury, Namita Roy. De, Prajna P. Dutta, Naba K.
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Ramachandran, V. S. (Vangipuram Seshachar)
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ScienceDirect http://www.sciencedirect.com/science/book/9780815514879
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Ramachandran, Vangipuram Seshachar, ed.
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TA 418.52 H36 2002
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Saisho, H. (Hideo) Gohshi, Y. (Yohichi)
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Feldman, Leonard C. Mayer, James W., 1930- Picraux, S. T., 1943-
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ScienceDirect http://www.sciencedirect.com/science/book/9780122526800
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Barbero, Ever J.
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TA418.9.C6 B3685 2013
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Barbero, Ever J.
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ONLINE(312865.1)
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Wooldridge, Jeffrey M.
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HB139 W663 2011
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Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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Naumenko, Konstantin. author. Altenbach, Holm. author. SpringerLink (Online service)
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Altenbach, Holm. editor. Jablonski, Frank. editor. Müller, Wolfgang H. editor. Naumenko, Konstantin. editor. Schneider, Patrick. editor.
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