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13. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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14. 
Cover image for Collection of simulated XRD powder patterns for zeolites
Collection of simulated XRD powder patterns for zeolites
Author 
Treacy, M. M. J. (Michael M. J.) Higgins, John B. Treacy, M. M. J. (Michael M. J.). Collection of simulated XRD powder patterns for zeolites. International Zeolite Association. Structure Commission.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444507020
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15. 
Cover image for Industrial applications of X-ray diffraction
Industrial applications of X-ray diffraction
Author 
Chung, Frank H., 1930- Smith, Deane K. (Deane Kingsley)
Preferred Shelf Number 
TA417.25 I52 2000
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Beytepe Library~1
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16. 
Cover image for Introduction to X-ray powder diffractometry
Introduction to X-ray powder diffractometry
Author 
Jenkins, Ron, 1932- Snyder, R. L. (Robert L.), 1941-
Preferred Shelf Number 
ONLINE
Electronic Access 
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/34476835.html
John Wiley http://dx.doi.org/10.1002/9781118520994
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