Limit Search Results
Author
SpringerLink (Online service)
(232)
Wiley InterScience (Online service)
(9)
Mukhopadhyay, Subhas Chandra. author.
(5)
Makinwa, Kofi A. A. author.
(4)
Mukhopadhyay, Subhas Chandra. editor.
(4)
Language
Publication Date
-
Subject
Electronics.
(201)
Microelectronics.
(147)
Engineering.
(96)
Electronics and Microelectronics, Instrumentation.
(79)
Electronic circuits.
(68)
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
328 Results Found Subscribe to search results
000000000000DEFAULT
Print
289. 
Cover image for Silicon science and advanced micro-device engineering I selected, peer reviewed papers from the 5th International Symposium on Silicon Science and the 1st International Conference on Advanced Micro-Device Engineering (ISSS & AMDE 2009), was held by the International Education and Research Center for Silicon Science and the Advanced Technology Research Center (ATEC), Gunma University on 10 and 11 December 2009 in Kiryu, Japan
Silicon science and advanced micro-device engineering I selected, peer reviewed papers from the 5th International Symposium on Silicon Science and the 1st International Conference on Advanced Micro-Device Engineering (ISSS & AMDE 2009), was held by the International Education and Research Center for Silicon Science and the Advanced Technology Research Center (ATEC), Gunma University on 10 and 11 December 2009 in Kiryu, Japan
Author 
International Symposium on Silicon Science (5th : 2009 : Kiryū-shi, Japan) Hanaizumi, Osamu. Unno, Masafumi. Gunma Daigaku. International Education and Research Center for Silicon Science. Gunma Daigaku. Advanced Technology Research Center.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=553111
Format: 
Availability 
Online Library~1
Available:
Copies:
290. 
Cover image for 3D IC stacking technology
3D IC stacking technology
Author 
Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.
Preferred Shelf Number 
ONLINE
Electronic Access 
Subscription required
Format: 
Availability 
Online Library~1
Available:
Copies:
291. 
Cover image for Digital holography for MEMS and microsystem metrology
Digital holography for MEMS and microsystem metrology
Author 
Asundi, Anand.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781119997290
http://lib.myilibrary.com?id=317798
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681
Format: 
Availability 
Online Library~1
Available:
Copies:
292. 
Cover image for Advanced signal integrity for high-speed digital designs
Advanced signal integrity for high-speed digital designs
Author 
Hall, Stephen H. Heck, Howard L.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024
Format: 
Availability 
Online Library~1
Available:
Copies:
293. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
Format: 
Availability 
Online Library~1
Available:
Copies:
294. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
Format: 
Availability 
Online Library~1
Available:
Copies:
295. 
Cover image for Design of cost-efficient interconnect processing units Spidergon STNoC
Design of cost-efficient interconnect processing units Spidergon STNoC
Author 
Coppola, Marcello.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
296. 
Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
297. 
Cover image for Microelectronic applications of chemical mechanical planarization
Microelectronic applications of chemical mechanical planarization
Author 
Li, Yuzhuo. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0742/2007015557-b.html
John Wiley http://dx.doi.org/10.1002/9780470180907
Format: 
Availability 
Online Library~1
Available:
Copies:
298. 
Cover image for Metamaterials with negative parameters theory, design and microwave applications
Metamaterials with negative parameters theory, design and microwave applications
Author 
Marqués, Ricardo, 1954- Martín, Ferran, 1965- Sorolla, Mario, 1958- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470191736
Format: 
Availability 
Online Library~1
Available:
Copies:
299. 
Cover image for Electron beams and microwave vacuum electronics
Electron beams and microwave vacuum electronics
Author 
Tsimring, Shulim E., 1924-
Preferred Shelf Number 
ONLINE
Electronic Access 
Click for information
http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780470053768
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=275883
John Wiley http://dx.doi.org/10.1002/0470053763
John Wiley http://dx.doi.org/10.1002/9780470053768
Format: 
Availability 
Online Library~1
Available:
Copies:
300. 
Cover image for Electronic components and technology
Electronic components and technology
Author 
Sangwine, Stephen.
Preferred Shelf Number 
TK7870 .S275 2007
Format: 
Availability 
Beytepe Library~1
Available:
Copies:
Select an Action