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1. 
Cover image for Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Author 
Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-28668-6
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2. 
Cover image for Science of Microscopy
Science of Microscopy
Author 
Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-49762-4
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3. 
Cover image for Physics of Zero- and One-Dimensional Nanoscopic Systems
Physics of Zero- and One-Dimensional Nanoscopic Systems
Author 
Karmakar, Sachindra Nath. editor. Maiti, Santanu Kumar. editor. Chowdhury, Jayeeta. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-72632-6
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4. 
Cover image for Square-Wave Voltammetry Theory and Application
Square-Wave Voltammetry Theory and Application
Author 
Mirceski, Valentin. author. Komorsky-Lovric, Sebojka. author. Lovric, Milivoj. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-73740-7
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5. 
Cover image for Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
Author 
Lang, Sidney B. author. Chan, Helen L. W. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-38039-1
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6. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-38347-5
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7. 
Cover image for Handbook of Practical X-Ray Fluorescence Analysis
Handbook of Practical X-Ray Fluorescence Analysis
Author 
Beckhoff, Burkhard. editor. Kanngießer, habil. Birgit. editor. Langhoff, Norbert. editor. Wedell, Reiner. editor. Wolff, Helmut. editor.
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http://dx.doi.org/10.1007/978-3-540-36722-2
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8. 
Cover image for Planewaves, Pseudopotentials and the LAPW Method
Planewaves, Pseudopotentials and the LAPW Method
Author 
Singh, David J. author. Nordström, Lars. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-29684-5
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9. 
Cover image for Semiconductor Physical Electronics
Semiconductor Physical Electronics
Author 
Li, Sheng S. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37766-2
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10. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37231-8
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11. 
Cover image for Neutron and X-ray Spectroscopy
Neutron and X-ray Spectroscopy
Author 
Hippert, Françoise. editor. Geissler, Erik. editor. Hodeau, Jean Louis. editor. Lelièvre-Berna, Eddy. editor. Regnard, Jean-René. editor.
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http://dx.doi.org/10.1007/1-4020-3337-0
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12. 
Cover image for Applied Scanning Probe Methods III Characterization
Applied Scanning Probe Methods III Characterization
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138285
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