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25. 
Cover image for Fundamentals of Nanoscale Film Analysis
Fundamentals of Nanoscale Film Analysis
Author 
Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-29261-8
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26. 
Cover image for Fundamentals of Radiation Materials Science Metals and Alloys
Fundamentals of Radiation Materials Science Metals and Alloys
Author 
Was, Gary S. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-49472-0
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27. 
Cover image for Square-Wave Voltammetry Theory and Application
Square-Wave Voltammetry Theory and Application
Author 
Mirceski, Valentin. author. Komorsky-Lovric, Sebojka. author. Lovric, Milivoj. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-73740-7
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28. 
Cover image for Handbook of Practical X-Ray Fluorescence Analysis
Handbook of Practical X-Ray Fluorescence Analysis
Author 
Beckhoff, Burkhard. editor. Kanngießer, habil. Birgit. editor. Langhoff, Norbert. editor. Wedell, Reiner. editor. Wolff, Helmut. editor.
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http://dx.doi.org/10.1007/978-3-540-36722-2
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29. 
Cover image for Metalle Struktur und Eigenschaften der Metalle und Legierungen
Metalle Struktur und Eigenschaften der Metalle und Legierungen
Author 
Hornbogen, Erhard. author. Warlimont, Hans. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-34011-4
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30. 
Cover image for Nanoscale Transistors Device Physics, Modeling and Simulation
Nanoscale Transistors Device Physics, Modeling and Simulation
Author 
Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28003-0
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31. 
Cover image for Solid State NMR Spectroscopy for Biopolymers Principles and Applications
Solid State NMR Spectroscopy for Biopolymers Principles and Applications
Author 
Saitô, Hazime. author. Ando, Isao. author. Naito, Akira. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-4303-1
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32. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37231-8
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33. 
Cover image for Planewaves, Pseudopotentials and the LAPW Method
Planewaves, Pseudopotentials and the LAPW Method
Author 
Singh, David J. author. Nordström, Lars. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-29684-5
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34. 
Cover image for Applied Scanning Probe Methods III Characterization
Applied Scanning Probe Methods III Characterization
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138285
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35. 
Cover image for Applied Scanning Probe Methods IV Industrial Applications
Applied Scanning Probe Methods IV Industrial Applications
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138289
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36. 
Cover image for Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139097
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