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25. 
Cover image for Spontaneous Symmetry Breaking, Self-Trapping, and Josephson Oscillations
Spontaneous Symmetry Breaking, Self-Trapping, and Josephson Oscillations
Author 
Malomed, Boris A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333101.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-21207-9
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26. 
Cover image for Effective Electron Mass in Low-Dimensional Semiconductors
Effective Electron Mass in Low-Dimensional Semiconductors
Author 
Bhattacharya, Sitangshu. author. Ghatak, Kamakhya Prasad. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333412.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-31248-9
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27. 
Cover image for Resonance Effects of Excitons and Electrons Basics and Applications
Resonance Effects of Excitons and Electrons Basics and Applications
Author 
Geru, Ion. author. Suter, Dieter. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334053.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-35807-4
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28. 
Cover image for Physics of Quantum Fluids New Trends and Hot Topics in Atomic and Polariton Condensates
Physics of Quantum Fluids New Trends and Hot Topics in Atomic and Polariton Condensates
Author 
Bramati, Alberto. editor. Modugno, Michele. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334454.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-37569-9
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29. 
Cover image for Biophysics and Structure to Counter Threats and Challenges
Biophysics and Structure to Counter Threats and Challenges
Author 
Puglisi, Joseph D. editor. Margaris, Manolia V. editor. SpringerLink (Online service)
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ONLINE(335850.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-4923-8
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30. 
Cover image for Inside Solid State Drives (SSDs)
Inside Solid State Drives (SSDs)
Author 
Micheloni, Rino. author. Marelli, Alessia. author. Eshghi, Kam. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335898.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-5146-0
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31. 
Cover image for Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Author 
Im, Seongil. author. Chang, Youn-Gyoung. author. Kim, Jae Hoon. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336233.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-6392-0
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