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1. 
Cover image for RFID Security A Lightweight Paradigm
RFID Security A Lightweight Paradigm
Author 
Khattab, Ahmed. author. Jeddi, Zahra. author. Amini, Esmaeil. author. Bayoumi, Magdy. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-47545-5
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2. 
Cover image for Emerging Technology and Architecture for Big-data Analytics
Emerging Technology and Architecture for Big-data Analytics
Author 
Chattopadhyay, Anupam. editor. (orcid)0000-0002-8818-6983 Chang, Chip Hong. editor. Yu, Hao. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-54840-1
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3. 
Cover image for Automatic Methods for the Refinement of System Models From the Specification to the Implementation
Automatic Methods for the Refinement of System Models From the Specification to the Implementation
Author 
Seiter, Julia. author. Wille, Robert. author. Drechsler, Rolf. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-41480-5
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4. 
Cover image for Designing with Xilinx® FPGAs Using Vivado
Designing with Xilinx® FPGAs Using Vivado
Author 
Churiwala, Sanjay. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-42438-5
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5. 
Cover image for Testing of Interposer-Based 2.5D Integrated Circuits
Testing of Interposer-Based 2.5D Integrated Circuits
Author 
Wang, Ran. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-54714-5
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6. 
Cover image for New Data Structures and Algorithms for Logic Synthesis and Verification
New Data Structures and Algorithms for Logic Synthesis and Verification
Author 
Amaru, Luca Gaetano. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-43174-1
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7. 
Cover image for Introduction to Logic Circuits & Logic Design with Verilog
Introduction to Logic Circuits & Logic Design with Verilog
Author 
LaMeres, Brock J. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-53883-9
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8. 
Cover image for Electromigration Inside Logic Cells Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Electromigration Inside Logic Cells Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Author 
Posser, Gracieli. author. Sapatnekar, Sachin S. author. Reis, Ricardo. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-48899-8
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9. 
Cover image for Reliable Software for Unreliable Hardware A Cross Layer Perspective
Reliable Software for Unreliable Hardware A Cross Layer Perspective
Author 
Rehman, Semeen. author. Shafique, Muhammad. author. Henkel, Jörg. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-25772-3
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10. 
Cover image for Near Threshold Computing Technology, Methods and Applications
Near Threshold Computing Technology, Methods and Applications
Author 
Hübner, Michael. editor. Silvano, Cristina. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-23389-5
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11. 
Cover image for FPGAs and Parallel Architectures for Aerospace Applications Soft Errors and Fault-Tolerant Design
FPGAs and Parallel Architectures for Aerospace Applications Soft Errors and Fault-Tolerant Design
Author 
Kastensmidt, Fernanda. editor. Rech, Paolo. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-14352-1
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12. 
Cover image for IP Cores Design from Specifications to Production Modeling, Verification, Optimization, and Protection
IP Cores Design from Specifications to Production Modeling, Verification, Optimization, and Protection
Author 
Mohamed, Khaled Salah. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-22035-2
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