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25. 
Cover image for Mechanics of impression evidence
Mechanics of impression evidence
Author 
Pierce, David (David S.), author.
Preferred Shelf Number 
HV8073 .P534 2011
Electronic Access 
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26. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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27. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
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28. 
Cover image for 2008+ Solved Problems in Electromagnetics
2008+ Solved Problems in Electromagnetics
Author 
Nasar, Syed A.
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ONLINE
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http://dx.doi.org/10.1049/SBEW037E
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29. 
Cover image for Electromagnetics
Electromagnetics
Author 
Rothwell, Edward J., author. Cloud, Michael J., author. Taylor and Francis.
Preferred Shelf Number 
QC760
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30. 
Cover image for DPSM for modeling engineering problems
DPSM for modeling engineering problems
Author 
Placko, Dominique. Kundu, T. (Tribikram) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Accès sur Numilog
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0740/2006038735-b.html
John Wiley http://dx.doi.org/10.1002/9780470142400
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31. 
Cover image for ESD RF technology and circuits
ESD RF technology and circuits
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Volltext http://www3.interscience.wiley.com/cgi-bin/bookhome/113386521
http://www3.interscience.wiley.com/cgi-bin/bookhome/113386521/ProductInformation.html
John Wiley http://dx.doi.org/10.1002/0470061405
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32. 
Cover image for ESD circuits and devices
ESD circuits and devices
Author 
Voldman, Steven H. John Wiley & Sons.
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ONLINE
Electronic Access 
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John Wiley http://dx.doi.org/10.1002/0470033479
http://www3.interscience.wiley.com/cgi-bin/bookhome/112572259
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33. 
Cover image for Contamination and ESD control in high technology manufacturing
Contamination and ESD control in high technology manufacturing
Author 
Welker, R. W. Nagarajan, R. (Ramamurthy) Newberg, Carl E. John Wiley & Sons.
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423
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34. 
Cover image for Fundamentals of engineering electromagnetics
Fundamentals of engineering electromagnetics
Author 
Bansal, Rajeev.
Preferred Shelf Number 
QC760 .F86 2006
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35. 
Cover image for Soft condensed matter physics in molecular and cell biology
Soft condensed matter physics in molecular and cell biology
Author 
Poon, W. C. K. (Wilson C. K.) Andelman, D. (David), 1955- Scottish Universities Summer School in Physics (59th : 2004 : Edinburgh, Scotland)
Preferred Shelf Number 
QC173.458 .S62 S648 2006
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36. 
Cover image for ESD physics and devices
ESD physics and devices
Author 
Voldman, Steven H.
Preferred Shelf Number 
ONLINE
Electronic Access 
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John Wiley http://dx.doi.org/10.1002/0470013508
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/55138678.html
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