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25. 
Cover image for POWER MANAGEMENT INTEGRATED CIRCUITS architecture design and implementation.
POWER MANAGEMENT INTEGRATED CIRCUITS architecture design and implementation.
Author 
Patra, Amit. Baranwal, Shailendra. Maity, Ashis. Dam, Samiran. Eqbal, Syed Asif.
Preferred Shelf Number 
TK7874.66
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003081760
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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26. 
Cover image for Design of function circuits with 555 timer integrated circuit
Design of function circuits with 555 timer integrated circuit
Author 
Selvam, K. C., author.
Preferred Shelf Number 
TK7895 .F8
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003362968
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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27. 
Cover image for Radiation Effects on Integrated Circuits and Systems for Space Applications
Radiation Effects on Integrated Circuits and Systems for Space Applications
Author 
Velazco, Raoul. editor. McMorrow, Dale. editor. Estela, Jaime. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-04660-6
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28. 
Cover image for Parasitic Substrate Coupling in High Voltage Integrated Circuits Minority and Majority Carriers Propagation in Semiconductor Substrate
Parasitic Substrate Coupling in High Voltage Integrated Circuits Minority and Majority Carriers Propagation in Semiconductor Substrate
Author 
Buccella, Pietro. author. Stefanucci, Camillo. author. Kayal, Maher. author. Sallese, Jean-Michel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-74382-0
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29. 
Cover image for Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing
Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing
Author 
Prinzie, Jeffrey. author. Steyaert, Michiel. author. Leroux, Paul. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-78616-2
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30. 
Cover image for Design of 3D integrated circuits and systems
Design of 3D integrated circuits and systems
Author 
Sharma, Rohit, editor.
Preferred Shelf Number 
TK7874.893 .D48 2014
Electronic Access 
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31. 
Cover image for Micro-Relay Technology for Energy-Efficient Integrated Circuits
Micro-Relay Technology for Energy-Efficient Integrated Circuits
Author 
Kam, Hei. author. Chen, Fred. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4939-2128-7
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32. 
Cover image for Arbitrary Modeling of TSVs for 3D Integrated Circuits
Arbitrary Modeling of TSVs for 3D Integrated Circuits
Author 
Salah, Khaled. author. Ismail, Yehea. author. El-Rouby, Alaa. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-07611-9
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33. 
Cover image for On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
Author 
Cui, Qiang. author. Liou, Juin J. author. Hajjar, Jean-Jacques. author. Salcedo, Javier. author. Zhou, Yuanzhong. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-10819-3
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34. 
Cover image for Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits
Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits
Author 
Yu, Wenjian. author. Wang, Xiren. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-642-54298-5
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35. 
Cover image for Ultra-Low Power Integrated Circuit Design Circuits, Systems, and Applications
Ultra-Low Power Integrated Circuit Design Circuits, Systems, and Applications
Author 
Tan, Nianxiong Nick. editor. Li, Dongmei. editor. Wang, Zhihua. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4419-9973-3
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36. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author 
Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
Preferred Shelf Number 
TK7871.99 .M44 T43 2014
Electronic Access 
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