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25. 
Cover image for Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-74080-3
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26. 
Cover image for Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Author 
Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-28668-6
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27. 
Cover image for Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-37316-2
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28. 
Cover image for Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139097
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29. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37231-8
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30. 
Cover image for Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Author 
Kaupp, Gerd. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-28472-7
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31. 
Cover image for Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
Author 
Egerton, Ray F. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136495
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32. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3019-3
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33. 
Cover image for Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Route to Femtosecond Ångstrom Technology
Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Route to Femtosecond Ångstrom Technology
Author 
Yamashita, Mikio. editor. Shigekawa, Hidemi. editor. Morita, Ryuji. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138671
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34. 
Cover image for Fundamentals of Solid State Engineering
Fundamentals of Solid State Engineering
Author 
Razeghi, Manijeh. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-75708-7
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35. 
Cover image for UV-VIS and Photoluminescence Spectroscopy for Nanomaterials Characterization
UV-VIS and Photoluminescence Spectroscopy for Nanomaterials Characterization
Author 
Kumar, Challa. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-27594-4
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36. 
Cover image for Local Electrode Atom Probe Tomography A User's Guide
Local Electrode Atom Probe Tomography A User's Guide
Author 
Larson, David J. author. Prosa, Ty J. author. Ulfig, Robert M. author. Geiser, Brian P. author. Kelly, Thomas F. author.
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http://dx.doi.org/10.1007/978-1-4614-8721-0
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