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25. 
Cover image for Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-85037-3
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26. 
Cover image for Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy
Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy
Author 
Khulbe, K. C. author. Feng, C. Y. author. Matsuura, Takeshi. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-73994-4
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27. 
Cover image for Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-74080-3
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28. 
Cover image for Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
Author 
Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-28668-6
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29. 
Cover image for Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-37316-2
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30. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-37231-8
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31. 
Cover image for Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139097
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32. 
Cover image for Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
Author 
Egerton, Ray F. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136495
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33. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3019-3
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34. 
Cover image for The Science of Solar System Ices
The Science of Solar System Ices
Author 
Gudipati, Murthy S. editor. Castillo-Rogez, Julie. editor. SpringerLink (Online service)
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ONLINE(331315.1)
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http://dx.doi.org/10.1007/978-1-4614-3076-6
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35. 
Cover image for Theory of Bilayer Graphene Spectroscopy
Theory of Bilayer Graphene Spectroscopy
Author 
Mucha-Kruczyński, Marcin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-30936-6
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36. 
Cover image for Transition-Metal Defects in Silicon New Insights from Photoluminescence Studies of Highly Enriched 28Si
Transition-Metal Defects in Silicon New Insights from Photoluminescence Studies of Highly Enriched 28Si
Author 
Steger, Michael. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-35079-5
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