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Library: Online Library

Author

SpringerLink (Online service)

(12)

Crowder, M. J. (Martin J.), 1943, author.

(2)

Bagdonavicius, V. (Vilijandas), author.

(1)

Balakrishnan, N., 1956- author.

(1)

Barolli, Leonard. editor.

(1)

Birolini, Alessandro. author.

(1)

Bruckstein, Alfred M. editor.

(1)

Calvo Rolle, José Luis. editor. (orcid)0000-0002-2333-8405

(1)

Chakrabarti, Amlan. editor.

(1)

Chen, Ding-Geng.

(1)

Chimitova, Ekaterina V., author.

(1)

Choi, Byeongkuen. editor.

(1)

Corchado, Emilio. editor.

(1)

Doumeingts, Guy, editor.

(1)

El Hami, Abdelkhalak. editor.

(1)

Estekanchi, Homayoon E., editor.

(1)

Fleming, Thomas R.

(1)

García Bringas, Pablo. editor.

(1)

Goje, Amol. editor.

(1)

Harrington, David P.

(1)

Herrero, Álvaro. editor. (orcid)0000-0002-2444-5384

(1)

Huber, Catherine.

(1)

Hudson, Harold Malcolm, author.

(1)

I-ESA (Conference) (9th : 2018 : Berlin, Germany)

(1)

Jaekel, Frank-Walter, editor.

(1)

John Wiley & Sons.

(1)

Kacprzyk, Janusz. editor. (orcid)0000-0003-4187-5877

(1)

Kadry, Seifedine. editor.

(1)

Kalbfleisch, J. D.

(1)

Kannan, SriRaman.

(1)

Khattree, Ravindra.

(1)

Kumar, Vijay. editor.

(1)

Lawless, Jerald F., 1944-

(1)

(1)

Lee, Woo Bang. editor.

(1)

Lefevre, Bruce G.

(1)

Ling, Man Ho, author.

(1)

LuValle, Michael J., author.

(1)

Ma, Jun (Statistics teacher), author.

(1)

Ma, Lin. editor.

(1)

Martínez de Pisón, Francisco Javier. editor. (orcid)0000-0002-3063-7374

(1)

Martínez Álvarez, Francisco. editor.

(1)

Mathew, Joseph. editor.

(1)

Mazurkiewicz, Jacek. editor.

(1)

Naik, Dayanand N.

(1)

Nelson, Wayne, 1936-

(1)

Nikulin, M. S. (Mikhail Stepanovich)

(1)

Nikulin, M. S. (Mikhail Stepanovich), author.

(1)

Peace, Karl E., 1941-

(1)

Pham, Hoang. editor.

(1)

(1)

Prentice, Ross L.

(1)

Pérez García, Hilde. editor. (orcid)0000-0001-7112-1983

(1)

Quintián, Héctor. editor. (orcid)0000-0002-0268-7999

(1)

Sharma, Neha. editor.

(1)

So, Hon Yiu, author.

(1)

Spizzichino, F. (Fabio), 1948, author.

(1)

Sugier, Jarosław. editor.

(1)

Sun, Jianguo, 1961-

(1)

Sun, Jianguo. author.

(1)

Thakor, Nitish V. editor.

(1)

(1)

Tricker, Samantha.

(1)

Troncoso Lora, Alicia. editor. (orcid)0000-0002-9801-7999

(1)

Vafai, Hassan A., editor.

(1)

Walkowiak, Tomasz. editor.

(1)

Wallace, Rodrick. author.

(1)

Wang, John Wenyu.

(1)

Webb, Annabel, author.

(1)

Wen, Shiping. editor.

(1)

Wessels, William R., author.

(1)

Wienke, Andreas., author.

(1)

Wiley InterScience (Online service)

(1)

Wollschlaeger, Martin, editor.

(1)

Yang, Cihui. editor.

(1)

Zamojski, Wojciech. editor.

(1)

Zelm, Martin, editor.

(1)

Language

(34)

Publication Date

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(7)

(2)

(2)

(2)

(2)

(2)

(2)

(2)

(2)

(1)

(1)

(1)

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(1)

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(1)

Subject

Failure time data analysis.

(12)

Computational intelligence.

(5)

Electronic books.

(4)

Survival analysis (Biometry)

(4)

Accelerated life testing.

(3)

Data Engineering.

(3)

Engineering -- Data processing.

(3)

Reliability (Engineering)

(3)

Accelerated life testing -- Statistical methods.

(2)

Artificial intelligence.

(2)

(2)

Competing risks.

(2)

Control engineering.

(2)

Industrial Management.

(2)

(2)

Medicine -- Research -- Statistical methods.

(2)

Security Science and Technology.

(2)

Security systems.

(2)

Accelerated life testing

(1)

Accelerated life testing -- Mathematical models.

(1)

Actes de congrès.

(1)

Analyse des défaillances (Ingénierie)

(1)

Applied Dynamical Systems.

(1)

(1)

(1)

Biology -- Research -- Data processing.

(1)

Biology -- Research -- Statistical methods.

(1)

(1)

Biomedical Engineering and Bioengineering.

(1)

Biomedical engineering.

(1)

(1)

Business and Management.

(1)

(1)

Chi-square test

(1)

Chi-square test.

(1)

Clinical trials -- Statistical methods.

(1)

Computational Mathematics and Numerical Analysis.

(1)

Computational biology.

(1)

Conference papers and proceedings

(1)

Conference papers and proceedings.

(1)

Control and Systems Theory.

(1)

Control, Robotics, Automation.

(1)

Demography -- Mathematics.

(1)

(1)

Earthquake resistant design.

(1)

Economic Development, Innovation and Growth.

(1)

Economic development.

(1)

(1)

Electric apparatus and appliances -- Testing.

(1)

Electric machinery -- Testing.

(1)

Electromechanical devices -- Environmental aspects.

(1)

Electromechanical devices -- Specifications.

(1)

Electronic apparatus and appliances -- Environmental aspects.

(1)

Electronic apparatus and appliances -- Specifications.

(1)

Electronic apparatus and appliances -- Testing.

(1)

Electronic books

(1)

Electronics and Microelectronics, Instrumentation.

(1)

(1)

Enterprise application integration (Computer systems)

(1)

Enterprise application integration (Computer systems) -- Congresses.

(1)

Environmental engineering -- Standards.

(1)

Environmental testing -- Standards.

(1)

Equipment Failure Analysis

(1)

Essais accélérés (Technologie)

(1)

Failure analysis (Engineering)

(1)

Failure time data analysis -- Data processing.

(1)

Failure time data analysis -- Mathematics.

(1)

Failure time data analysis -- Standards.

(1)

Financial risk management.

(1)

Industrial organization.

(1)

Intégration d'applications d'entreprise (Systèmes informatiques) -- Congrès.

(1)

MATHEMATICS -- Applied.

(1)

MATHEMATICS -- Probability & Statistics -- General.

(1)

MATHEMATICS / Probability & Statistics / General

(1)

Machines, Tools, Processes.

(1)

Management information systems

(1)

Management information systems -- Congresses.

(1)

Management science.

(1)

(1)

Martingales (Mathematics)

(1)

Mathematical Modeling and Industrial Mathematics.

(1)

Mathematical models.

(1)

Mathematical physics.

(1)

Mathematics -- Data processing.

(1)

Mechanics, Applied.

(1)

Medicine -- Research -- Data processing.

(1)

Models, Statistical.

(1)

Mortality -- Mathematical models.

(1)

Multivariate analysis.

(1)

(1)

(1)

Nonlinear theories.

(1)

(1)

Point processes.

(1)

(1)

Probability & Statistics.

(1)

Product life cycle.

(1)

Prognosis -- Statistical methods.

(1)

R (Computer program language) -- Statistical methods.

(1)

REFERENCE / General

(1)

(1)

Regression analysis.

(1)

Reliability (Engineering) -- Statistical methods.

(1)

Risk Management.

(1)

(1)

Solid Mechanics.

(1)

(1)

(1)

Survival Analysis.

(1)

Survival analysis (Biometry) -- Data processing.

(1)

Survival analysis (Biometry) -- Mathematics.

(1)

Systèmes d'information de gestion -- Congrès.

(1)

TECHNOLOGY & ENGINEERING -- Mechanical.

(1)

TECHNOLOGY / Engineering / Civil

(1)

Test du khi-carré.

(1)

Theoretical, Mathematical and Computational Physics.

(1)

accelerated aging.

(1)

proceedings (reports)

(1)

Material Type

Shelf Location

Electronic Library

Taylor Francis E-Book Collection

Wiley E-Book Collection

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1.

Cover image for Counting processes and survival analysis

Counting processes and survival analysis

Counting processes and survival analysis

Author

Fleming, Thomas R. Harrington, David P. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Spis treści http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html
ebrary http://site.ebrary.com/id/10509867
http://site.ebrary.com/lib/alltitles/Doc?id=10509867

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2.

Cover image for Accelerated testing and validation testing, engineering, and management tools for lean development

Accelerated testing and validation testing, engineering, and management tools for lean development

Accelerated testing and validation testing, engineering, and management tools for lean development

Author

Porter, Alex.

Preferred Shelf Number

ONLINE

Electronic Access

Volltext http://www.sciencedirect.com/science/book/9780750676533

Format:

Availability

Online Library~1

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3.

Cover image for Design and analysis of accelerated tests for mission critical reliability

Design and analysis of accelerated tests for mission critical reliability

Design and analysis of accelerated tests for mission critical reliability

Author

LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.

Preferred Shelf Number

TA169.3 .L88 2004

Electronic Access

Click here to view.

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4.

Cover image for Statistical methods for survival data analysis

Statistical methods for survival data analysis

Statistical methods for survival data analysis

Author

Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/0471458546
http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html

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Online Library~1

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5.

Cover image for Statistical models and methods for lifetime data

Statistical models and methods for lifetime data

Statistical models and methods for lifetime data

Author

Lawless, Jerald F., 1944-

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9781118033005
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html

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Online Library~1

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6.

Cover image for Accelerated life models : modeling and statistical analysis

Accelerated life models : modeling and statistical analysis

Accelerated life models : modeling and statistical analysis

Author

Bagdonavicius, V. (Vilijandas), author. Nikulin, M. S. (Mikhail Stepanovich)

Preferred Shelf Number

TA169.3 .N55 2002

Electronic Access

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7.

Cover image for Classical competing risks

Classical competing risks

Classical competing risks

Author

Crowder, M. J. (Martin J.), 1943, author.

Preferred Shelf Number

QA273 .C855 2001

Electronic Access

Click here to view.

Format:

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Online Library~1

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8.

Cover image for Subjective probability models for lifetimes

Subjective probability models for lifetimes

Subjective probability models for lifetimes

Author

Spizzichino, F. (Fabio), 1948, author.

Preferred Shelf Number

QA276 .S66 2001

Electronic Access

Click here to view.

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9.

Cover image for Environmental requirements for electromechanical and electronic equipment

Environmental requirements for electromechanical and electronic equipment

Environmental requirements for electromechanical and electronic equipment

Author

Tricker, Ray. Tricker, Samantha.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750639026

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10.

Cover image for Accelerated testing statistical models, test plans and data analyses

Accelerated testing statistical models, test plans and data analyses

Accelerated testing statistical models, test plans and data analyses

Author

Nelson, Wayne, 1936-

Preferred Shelf Number

ONLINE

Electronic Access

Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757
John Wiley http://dx.doi.org/10.1002/9780470316795
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html

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