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25. 
Cover image for Run-to-run control in semiconductor manufacturing
Run-to-run control in semiconductor manufacturing
Author 
Del Castillo, Enrique. Hurwitz, Arnon Max. Moyne, James.
Preferred Shelf Number 
TK7871.85 .R863 2001
Electronic Access 
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26. 
Cover image for Inside the FFT black box : serial and parallel fast Fourier transform algorithms
Inside the FFT black box : serial and parallel fast Fourier transform algorithms
Author 
Chu, Eleanor Chin-hwa, 1950- George, Alan.
Preferred Shelf Number 
QA403.5 C5 2000
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781420049961
Taylor & Francis https://www.taylorfrancis.com/books/9780367802332
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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