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25. 
Cover image for Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-74080-3
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26. 
Cover image for Applied Scanning Probe Methods IX Characterization
Applied Scanning Probe Methods IX Characterization
Author 
Tomitori, Masahiko. editor. Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-74083-4
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27. 
Cover image for Applied Scanning Probe Methods X Biomimetics and Industrial Applications
Applied Scanning Probe Methods X Biomimetics and Industrial Applications
Author 
Bhushan, Bharat. editor. Tomitori, Masahiko. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-74085-8
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28. 
Cover image for Messtechnik Systemtheorie für Elektrotechniker
Messtechnik Systemtheorie für Elektrotechniker
Author 
Kiencke, Uwe. author. Eger, Ralf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-78429-6
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29. 
Cover image for Regelungstechnik 2 Mehrgrößensysteme, Digitale Regelung
Regelungstechnik 2 Mehrgrößensysteme, Digitale Regelung
Author 
Lunze, Jan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-78463-0
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30. 
Cover image for Quantum field theory demystified
Quantum field theory demystified
Author 
McMahon, David.
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ONLINE
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=227397
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31. 
Cover image for Semiconductor Nanocrystal Quantum Dots Synthesis, Assembly, Spectroscopy and Applications
Semiconductor Nanocrystal Quantum Dots Synthesis, Assembly, Spectroscopy and Applications
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Rogach, Andrey L. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-211-75237-1
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32. 
Cover image for Quantum Optics
Quantum Optics
Author 
Walls, D.F. editor. Milburn, Gerard J. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-28574-8
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33. 
Cover image for Fine particle technology and characterization
Fine particle technology and characterization
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Yekeler, Meftuni.
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TP156.P3 Y43 2008
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Beytepe Library~1
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34. 
Cover image for Developments in surface contamination and cleaning fundamentals and applied aspects
Developments in surface contamination and cleaning fundamentals and applied aspects
Author 
Kohli, Rajiv, 1947- Mittal, K. L., 1945-
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Volltext http://www.sciencedirect.com/science/book/9780815515555
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35. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8615-1
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36. 
Cover image for Theory and design of charged particle beams
Theory and design of charged particle beams
Author 
Reiser, M. (Martin), 1931- Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9783527622047
MyiLibrary, Table of contents http://www.myilibrary.com?id=237226&ref=toc
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