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1. 
Cover image for Embedded systems and wireless technology
Embedded systems and wireless technology
Author 
Aquino Santos, Raul, 1965- Block, Arthur Edwards, 1957-
Preferred Shelf Number 
TK5105.77 .E43 2012
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2. 
Cover image for Visual cryptography and secret image sharing
Visual cryptography and secret image sharing
Author 
Cimato, Stelvio. Yang, Ching-Nung.
Preferred Shelf Number 
TA1637 .V544 2012
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3. 
Cover image for Adobe Photoshop CS4
Adobe Photoshop CS4
Author 
Perkins, Chad.
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ONLINE
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4. 
Cover image for Adobe Illustrator CS4
Adobe Illustrator CS4
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Jenkins, Sue, 1966-
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5. 
Cover image for CorelDRAW X6 the official guide
CorelDRAW X6 the official guide
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Bouton, Gary David, 1953-
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6. 
Cover image for Photoshop CS4
Photoshop CS4
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Bouton, Gary David, 1953- Matthews, Carole Boggs.
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7. 
Cover image for Digital photography
Digital photography
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Rich, Jason.
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8. 
Cover image for How to cheat in Photoshop Elements 10 : release your imagination
How to cheat in Photoshop Elements 10 : release your imagination
Author 
Asch, David. Caplin, Steve.
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ONLINE(342462.1)
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9. 
Cover image for The Adobe Photoshop layers book
The Adobe Photoshop layers book
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Lynch, Richard (Richard A.)
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ONLINE(342522.1)
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10. 
Cover image for Digital holography
Digital holography
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Picart, Pascal. Li, Junchang, 1945-
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ONLINE
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Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118562567
ebrary http://oclc-marc.ebrary.com/Doc?id=10653866
http://lib.myilibrary.com?id=445892
John Wiley http://dx.doi.org/10.1002/9781118562567
ebrary http://site.ebrary.com/id/10653866
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11. 
Cover image for Making media foundations of sound and image production
Making media foundations of sound and image production
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Roberts-Breslin, Jan.
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12. 
Cover image for Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
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International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan) Yamada-Kaneta, Hiroshi. Sakai, Akira.
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215
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