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25. 
Cover image for Integrated Optical Interconnect Architectures for Embedded Systems
Integrated Optical Interconnect Architectures for Embedded Systems
Author 
O'Connor, Ian. editor. Nicolescu, Gabriela. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(330817.1)
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http://dx.doi.org/10.1007/978-1-4419-6193-8
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26. 
Cover image for Automotive Radar Sensors in Silicon Technologies
Automotive Radar Sensors in Silicon Technologies
Author 
Jain, Vipul. author. Heydari, Payam. author. SpringerLink (Online service)
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ONLINE(330821.1)
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http://dx.doi.org/10.1007/978-1-4419-6775-6
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27. 
Cover image for Adaptable Embedded Systems
Adaptable Embedded Systems
Author 
Beck, Antonio Carlos Schneider. editor. Lang Lisbôa, Carlos Arthur. editor. Carro, Luigi. editor. SpringerLink (Online service)
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ONLINE(331281.1)
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http://dx.doi.org/10.1007/978-1-4614-1746-0
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28. 
Cover image for Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Author 
Abu-Rahma, Mohamed H. author. Anis, Mohab. author. SpringerLink (Online service)
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ONLINE(331282.1)
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http://dx.doi.org/10.1007/978-1-4614-1749-1
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29. 
Cover image for Bio/CMOS Interfaces and Co-Design
Bio/CMOS Interfaces and Co-Design
Author 
Carrara, Sandro. author. SpringerLink (Online service)
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ONLINE(331564.1)
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http://dx.doi.org/10.1007/978-1-4614-4690-3
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30. 
Cover image for Global Design and Local Materialization 15th International Conference, CAAD Futures 2013, Shanghai, China, July 3-5, 2013. Proceedings
Global Design and Local Materialization 15th International Conference, CAAD Futures 2013, Shanghai, China, July 3-5, 2013. Proceedings
Author 
Zhang, Jianlong. editor. Sun, Chengyu. editor. SpringerLink (Online service)
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ONLINE(334705.1)
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http://dx.doi.org/10.1007/978-3-642-38974-0
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31. 
Cover image for Embedded Systems: Design, Analysis and Verification 4th IFIP TC 10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 17-19, 2013. Proceedings
Embedded Systems: Design, Analysis and Verification 4th IFIP TC 10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 17-19, 2013. Proceedings
Author 
Schirner, Gunar. editor. Götz, Marcelo. editor. Rettberg, Achim. editor. Zanella, Mauro C. editor. Rammig, Franz J. editor.
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ONLINE(334682.1)
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http://dx.doi.org/10.1007/978-3-642-38853-8
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32. 
Cover image for Projektierung von Automatisierungsanlagen Eine effektive und anschauliche Einführung
Projektierung von Automatisierungsanlagen Eine effektive und anschauliche Einführung
Author 
Bindel, Thomas. author. Hofmann, Dieter. author. SpringerLink (Online service)
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ONLINE(338314.1)
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http://dx.doi.org/10.1007/978-3-8348-2082-2
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33. 
Cover image for SystemVerilog for Verification A Guide to Learning the Testbench Language Features
SystemVerilog for Verification A Guide to Learning the Testbench Language Features
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Spear, Chris. author. Tumbush, Greg. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0715-7
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34. 
Cover image for Cartesian Genetic Programming
Cartesian Genetic Programming
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Miller, Julian F. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-17310-3
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35. 
Cover image for SystemC: From the Ground Up
SystemC: From the Ground Up
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Black, David C. author. Donovan, Jack. author. Bunton, Bill. author. Keist, Anna. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-69958-5
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36. 
Cover image for Fault Location on Power Networks
Fault Location on Power Networks
Author 
Saha, Murari Mohan. author. Izykowski, Jan. author. Rosolowski, Eugeniusz. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-84882-886-5
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