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25. 
Cover image for Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Author 
Shen, Ruijing. author. Tan, Sheldon X.-D. author. Yu, Hao. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0788-1
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26. 
Cover image for Reliability, Availability and Serviceability of Networks-on-Chip
Reliability, Availability and Serviceability of Networks-on-Chip
Author 
Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0791-1
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27. 
Cover image for Automated Configuration Problem Solving
Automated Configuration Problem Solving
Author 
Petrie, Charles J. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-4532-6
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28. 
Cover image for VLSI Physical Design: From Graph Partitioning to Timing Closure
VLSI Physical Design: From Graph Partitioning to Timing Closure
Author 
Kahng, Andrew B. author. Lienig, Jens. author. Markov, Igor L. author. Hu, Jin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-9591-6
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29. 
Cover image for Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Author 
Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-9725-5
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30. 
Cover image for Regular Nanofabrics in Emerging Technologies Design and Fabrication Methods for Nanoscale Digital Circuits
Regular Nanofabrics in Emerging Technologies Design and Fabrication Methods for Nanoscale Digital Circuits
Author 
Ben Jamaa, M. Haykel. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-94-007-0650-7
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31. 
Cover image for Dependability in Electronic Systems Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Dependability in Electronic Systems Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Author 
Kanekawa, Nobuyasu. author. Ibe, Eishi H. author. Suga, Takashi. author. Uematsu, Yutaka. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6715-2
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32. 
Cover image for Ultra Low-Power Integrated Circuit Design for Wireless Neural Interfaces
Ultra Low-Power Integrated Circuit Design for Wireless Neural Interfaces
Author 
Holleman, Jeremy. author. Zhang, Fan. author. Otis, Brian. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6727-5
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33. 
Cover image for Wearable Monitoring Systems
Wearable Monitoring Systems
Author 
Bonfiglio, Annalisa. editor. De Rossi, Danilo. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7384-9
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34. 
Cover image for Run-time Adaptation for Reconfigurable Embedded Processors
Run-time Adaptation for Reconfigurable Embedded Processors
Author 
Bauer, Lars. author. Henkel, Jörg. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7412-9
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35. 
Cover image for Low-Power Variation-Tolerant Design in Nanometer Silicon
Low-Power Variation-Tolerant Design in Nanometer Silicon
Author 
Bhunia, Swarup. editor. Mukhopadhyay, Saibal. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7418-1
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36. 
Cover image for Introduction to Mixed-Signal, Embedded Design
Introduction to Mixed-Signal, Embedded Design
Author 
Doboli, Alex. author. Currie, Edward H. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7446-4
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