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Cover image for Advances in Production Management Systems. The Path to Intelligent, Collaborative and Sustainable Manufacturing IFIP WG 5.7 International Conference, APMS 2017, Hamburg, Germany, September 3-7, 2017, Proceedings, Part II
Advances in Production Management Systems. The Path to Intelligent, Collaborative and Sustainable Manufacturing IFIP WG 5.7 International Conference, APMS 2017, Hamburg, Germany, September 3-7, 2017, Proceedings, Part II
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Lödding, Hermann. editor. Riedel, Ralph. editor. Thoben, Klaus-Dieter. editor. von Cieminski, Gregor. editor. Kiritsis, Dimitris. editor.
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https://doi.org/10.1007/978-3-319-66926-7
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Cover image for VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
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Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.
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https://doi.org/10.1007/978-3-319-67104-8
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27. 
Cover image for Designing Around People CWUAAT 2016
Designing Around People CWUAAT 2016
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Langdon, Pat. editor. Lazar, Jonathan. editor. Heylighen, Ann. editor. Dong, Hua. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-29498-8
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28. 
Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
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https://doi.org/10.1007/978-3-319-46097-0
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