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25. 
Cover image for Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author 
Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-94-007-7663-0
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26. 
Cover image for Semiconductor Technologies in the Era of Electronics
Semiconductor Technologies in the Era of Electronics
Author 
Kang, Yong Hoon. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-94-017-8768-0
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27. 
Cover image for Katıhal elektroniği devre elemanları
Katıhal elektroniği devre elemanları
Author 
Streetman, Ben G. Banerjee, Sanjay Kumar. Merdan, Mustafa.
Preferred Shelf Number 
TK7871.85 S771 2014
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28. 
Cover image for Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Author 
Kimoto, Tsunenobu, 1963- author. Cooper, James A., 1946- author.
Preferred Shelf Number 
ONLINE(341501.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781118313534
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118313558
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29. 
Cover image for Energy-Efficient Fault-Tolerant Systems
Energy-Efficient Fault-Tolerant Systems
Author 
Mathew, Jimson. editor. Shafik, Rishad A. editor. Pradhan, Dhiraj K. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-4193-9
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30. 
Cover image for Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Author 
Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-02378-6
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31. 
Cover image for Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Author 
Richter, Detlev. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-6082-0
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32. 
Cover image for Trace-Based Post-Silicon Validation for VLSI Circuits
Trace-Based Post-Silicon Validation for VLSI Circuits
Author 
Liu, Xiao. author. Xu, Qiang. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-00533-1
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33. 
Cover image for Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Author 
Samukawa, Seiji. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-4-431-54795-2
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34. 
Cover image for Transmission electron microscopy in micro-nanoelectronics
Transmission electron microscopy in micro-nanoelectronics
Author 
Claverie, A. (Alain)
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321
John Wiley http://dx.doi.org/10.1002/9781118579022
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118579053
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118579022
Volltext http://proquest.tech.safaribooksonline.de/9781118579053
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35. 
Cover image for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Author 
van Schooten, Kipp. author. SpringerLink (Online service)
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ONLINE(332776.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00590-4
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36. 
Cover image for Toward Quantum FinFET
Toward Quantum FinFET
Author 
Han, Weihua. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
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ONLINE(332897.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02021-1
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