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25. 
Cover image for MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
Author 
Srivastava, Viranjay M. author. Singh, Ghanshyam. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-01165-3
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26. 
Cover image for Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Author 
Richter, Detlev. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-94-007-6082-0
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27. 
Cover image for Semiconductor Technologies in the Era of Electronics
Semiconductor Technologies in the Era of Electronics
Author 
Kang, Yong Hoon. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-94-017-8768-0
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28. 
Cover image for Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author 
Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-7663-0
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29. 
Cover image for Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Author 
Samukawa, Seiji. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-4-431-54795-2
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30. 
Cover image for Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Author 
Kimoto, Tsunenobu, 1963- author. Cooper, James A., 1946- author.
Preferred Shelf Number 
ONLINE(341501.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781118313534
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118313558
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31. 
Cover image for Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Author 
Grasser, Tibor. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-7909-3
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32. 
Cover image for Energy-Efficient Fault-Tolerant Systems
Energy-Efficient Fault-Tolerant Systems
Author 
Mathew, Jimson. editor. Shafik, Rishad A. editor. Pradhan, Dhiraj K. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-4193-9
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33. 
Cover image for Exploring Memory Hierarchy Design with Emerging Memory Technologies
Exploring Memory Hierarchy Design with Emerging Memory Technologies
Author 
Sun, Guangyu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-00681-9
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34. 
Cover image for Transmission electron microscopy in micro-nanoelectronics
Transmission electron microscopy in micro-nanoelectronics
Author 
Claverie, A. (Alain)
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321
John Wiley http://dx.doi.org/10.1002/9781118579022
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118579053
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118579022
Volltext http://proquest.tech.safaribooksonline.de/9781118579053
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35. 
Cover image for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Author 
van Schooten, Kipp. author. SpringerLink (Online service)
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ONLINE(332776.1)
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http://dx.doi.org/10.1007/978-3-319-00590-4
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36. 
Cover image for Semiconductor Lasers Stability, Instability and Chaos
Semiconductor Lasers Stability, Instability and Chaos
Author 
Ohtsubo, Junji. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333297.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-30147-6
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