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1. 
Cover image for Handbook of semiconductor manufacturing technology
Handbook of semiconductor manufacturing technology
Author 
Doering, Robert, 1946- Nishi, Yoshio, 1940-
Preferred Shelf Number 
TK7871.85 .H3335 2008
Electronic Access 
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2. 
Cover image for Bayesian process monitoring, control and optimization
Bayesian process monitoring, control and optimization
Author 
Colosimo, Bianca M. Del Castillo, Enrique.
Preferred Shelf Number 
TS156.8 .B39 2007
Electronic Access 
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3. 
Cover image for Low-power HF Microelectronics A unified approach
Low-power HF Microelectronics A unified approach
Author 
Machado, Gerson A. S., ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS008E
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4. 
Cover image for Electronics reliability and measurement technology nondestructive evaluation
Electronics reliability and measurement technology nondestructive evaluation
Author 
Heyman, Joseph S.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780815511717
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