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37. 
Cover image for Neutron and X-ray Spectroscopy
Neutron and X-ray Spectroscopy
Author 
Hippert, Françoise. editor. Geissler, Erik. editor. Hodeau, Jean Louis. editor. Lelièvre-Berna, Eddy. editor. Regnard, Jean-René. editor.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3337-0
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38. 
Cover image for Applied Scanning Probe Methods III Characterization
Applied Scanning Probe Methods III Characterization
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138285
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39. 
Cover image for Applied Scanning Probe Methods IV Industrial Applications
Applied Scanning Probe Methods IV Industrial Applications
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/b138289
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40. 
Cover image for Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/b139097
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41. 
Cover image for Novel NMR and EPR techniques
Novel NMR and EPR techniques
Author 
Dolinšek, Janez. editor. Vilfan, Marija. editor. Žumer, Slobodan. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b11540830
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42. 
Cover image for Handbook of Practical X-Ray Fluorescence Analysis
Handbook of Practical X-Ray Fluorescence Analysis
Author 
Beckhoff, Burkhard. editor. Kanngießer, habil. Birgit. editor. Langhoff, Norbert. editor. Wedell, Reiner. editor. Wolff, Helmut. editor.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-36722-2
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43. 
Cover image for X-Ray Diffraction by Macromolecules
X-Ray Diffraction by Macromolecules
Author 
Kasai, Nobutami. author. Kakudo, Masao. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28353-6
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44. 
Cover image for Fundamentals of Powder Diffraction and Structural Characterization of Materials
Fundamentals of Powder Diffraction and Structural Characterization of Materials
Author 
Pecharsky, Vitalij K. author. Zavalij, Peter Y. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b106242
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45. 
Cover image for Thin Films and Heterostructures for Oxide Electronics
Thin Films and Heterostructures for Oxide Electronics
Author 
Ogale, Satischandra B. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136780
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46. 
Cover image for Electron Scattering From Atoms, Molecules, Nuclei, and Bulk Matter
Electron Scattering From Atoms, Molecules, Nuclei, and Bulk Matter
Author 
Whelan, Colm T. editor. Mason, Nigel J. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-27567-3
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47. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138175
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48. 
Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Author 
Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-31915-8
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