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37. 
Cover image for The Physics of Semiconductors An Introduction Including Devices and Nanophysics
The Physics of Semiconductors An Introduction Including Devices and Nanophysics
Author 
Grundmann, Marius. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-34661-9
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38. 
Cover image for IWNMS 2004 Proceedings of the International Workshop on Nanomaterials, Magnetic Ions and Magnetic Semiconductors Studied Mostly by Hyperfine Interactions (IWNMS 2004) held in Baroda, India, 10–14 February 2004
IWNMS 2004 Proceedings of the International Workshop on Nanomaterials, Magnetic Ions and Magnetic Semiconductors Studied Mostly by Hyperfine Interactions (IWNMS 2004) held in Baroda, India, 10–14 February 2004
Author 
Somayajulu, D. R. S. editor. Lieb, K. -P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-29194-6
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39. 
Cover image for Light-Emitting Diodes Materials, Processes, Devices and Applications
Light-Emitting Diodes Materials, Processes, Devices and Applications
Author 
Li, Jinmin. editor. Zhang, G. Q. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-99211-2
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40. 
Cover image for Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Author 
Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-02378-6
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41. 
Cover image for Trace-Based Post-Silicon Validation for VLSI Circuits
Trace-Based Post-Silicon Validation for VLSI Circuits
Author 
Liu, Xiao. author. Xu, Qiang. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-00533-1
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42. 
Cover image for Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Author 
Richter, Detlev. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-6082-0
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43. 
Cover image for Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author 
Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-7663-0
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44. 
Cover image for Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Author 
Samukawa, Seiji. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-4-431-54795-2
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45. 
Cover image for Energy-Efficient Fault-Tolerant Systems
Energy-Efficient Fault-Tolerant Systems
Author 
Mathew, Jimson. editor. Shafik, Rishad A. editor. Pradhan, Dhiraj K. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-4193-9
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46. 
Cover image for Exploring Memory Hierarchy Design with Emerging Memory Technologies
Exploring Memory Hierarchy Design with Emerging Memory Technologies
Author 
Sun, Guangyu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-00681-9
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47. 
Cover image for MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
Author 
Srivastava, Viranjay M. author. Singh, Ghanshyam. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-01165-3
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48. 
Cover image for Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Author 
Grasser, Tibor. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-7909-3
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