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37. 
Cover image for Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988
Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988
Author 
Symposium C on Superconducting and Low-Temperature Particle Detectors (1988 : Strasbourg, France) Waysand, G. Chardin, G. European Materials Research Society. Meeting (1988 : Strasbourg, France)
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ScienceDirect http://www.sciencedirect.com/science/book/9780444874146
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38. 
Cover image for Advances in metallurgical and mining engineering : selected, peer reviewed papers from the International Conference on Chemical, Material and Metallurgical Engineering (ICCMME 2011), December 23-25, 2011, Beihai, China
Advances in metallurgical and mining engineering : selected, peer reviewed papers from the International Conference on Chemical, Material and Metallurgical Engineering (ICCMME 2011), December 23-25, 2011, Beihai, China
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International Conference on Chemical, Material and Metallurgical Engineering (1st : 2011 : Beihai, China) Zhu, Hongxi, editor. Wang, Linjiang, editor.
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39. 
Cover image for Manufacturing engineering and process selected, peer reviewed papers from the 2012 International Conference on Manufacturing Engineering and Process (ICMEP 2012) April 21-22, 2012, Kunming, China
Manufacturing engineering and process selected, peer reviewed papers from the 2012 International Conference on Manufacturing Engineering and Process (ICMEP 2012) April 21-22, 2012, Kunming, China
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International Conference on Manufacturing Engineering and Process (2012 : Kunming, China) Zhou, Xiaoxiao, editor of compilation.
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40. 
Cover image for Advanced research on material science, environmental science and computer science selected, peer reviewed papers from the 2012 2nd International Conference on Material Science, Environmental Science and Computer Science (MSESCS2012) August 25-26, 2012, Wuhan, China
Advanced research on material science, environmental science and computer science selected, peer reviewed papers from the 2012 2nd International Conference on Material Science, Environmental Science and Computer Science (MSESCS2012) August 25-26, 2012, Wuhan, China
Author 
International Conference on Material Science, Environmental Science and Computer Science (2nd : 2012 : Wuhan, China) Zhang, Helen, editor of compilation. Jin, David, editor of compilation. Zhao, X. J., editor of compilation.
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41. 
Cover image for Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, China
Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, China
Author 
International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.
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42. 
Cover image for Nanoscaled semiconductor-on-insulator materials, sensors and devices selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine
Nanoscaled semiconductor-on-insulator materials, sensors and devices selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine
Author 
International Workshop on Semiconductor-on-Insulator Materials and Devices (6th : 2010 : Kiev, Ukraine) Nazarov, A. N. (Alexei N.) Raskin, J.-P. (Jean-Pierre), 1971-
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43. 
Cover image for CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications
CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications
Author 
Triboulet, R. Siffert, P. (Paul)
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44. 
Cover image for CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
Author 
Triboulet, R. Siffert, P. (Paul)
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45. 
Cover image for Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995
Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995
Author 
Symposium A on Microstructuring and Microsystems (1995 : Strasbourg, France) Rooij, N. F. de. Symposium B on Materials for Sensors: Functional Nanoscaled Structures (1995 : Strasbourg, France) Symposium E on Structure and Properties of Metallic Thin Films and Multilayers (1995 : Strasbourg, France)
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46. 
Cover image for Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995
Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995
Author 
Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation (1995 : Strasbourg, France) Hemment, P. L. F. (Peter L. F.)
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47. 
Cover image for C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Author 
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)
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48. 
Cover image for Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991
Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991
Author 
Symposium E on Nuclear Materials for Fission Reactors (1991 : Strasbourg, France) Matzke, Hj., 1936- Schumacher, G.
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