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37. 
Cover image for Embedded Memories for Nano-Scale VLSIs
Embedded Memories for Nano-Scale VLSIs
Author 
Zhang, Kevin. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-88497-4
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38. 
Cover image for Into the Nano Era Moore’s Law Beyond Planar Silicon CMOS
Into the Nano Era Moore’s Law Beyond Planar Silicon CMOS
Author 
Huff, Howard R. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-74559-4
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39. 
Cover image for Nanotechnologies
Nanotechnologies
Author 
Wautelet, M. nanomagnetism
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ONLINE
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http://dx.doi.org/10.1049/PBCS022E
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40. 
Cover image for Functional Thin Films and Nanostructures for Sensors Synthesis, Physics and Applications
Functional Thin Films and Nanostructures for Sensors Synthesis, Physics and Applications
Author 
Fortin, Jeffrey. editor. Zribi, Anis. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138612
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41. 
Cover image for More than Moore Creating High Value Micro/Nanoelectronics Systems
More than Moore Creating High Value Micro/Nanoelectronics Systems
Author 
Zhang, Guo Qi. editor. Roosmalen, Alfred. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-75593-9
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42. 
Cover image for Nanoscale Phenomena Basic Science to Device Applications
Nanoscale Phenomena Basic Science to Device Applications
Author 
Tang, Zikang. editor. Sheng, Ping. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-73048-6
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43. 
Cover image for Precision Motion Control Design and Implementation
Precision Motion Control Design and Implementation
Author 
Kiong, Tan Kok. author. Heng, Lee Tong. author. Sunan, Huang. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-84800-021-6
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44. 
Cover image for Radio Frequency Integrated Circuits and Technologies
Radio Frequency Integrated Circuits and Technologies
Author 
Ellinger, Frank. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-69325-3
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45. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74747-7
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46. 
Cover image for Semiconductor Nanostructures
Semiconductor Nanostructures
Author 
Bimberg, Dieter. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-77899-8
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47. 
Cover image for Thermal Transport for Applications in Micro/Nanomachining
Thermal Transport for Applications in Micro/Nanomachining
Author 
Wong, Basil T. author. Mengüç, M. Pinar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-73607-3
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48. 
Cover image for Piezoelectric Transducers and Applications
Piezoelectric Transducers and Applications
Author 
Vives, Antonio Arnau. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-77508-9
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