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37. 
Cover image for Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Author 
Pajot, Bernard. author. Clerjaud, Bernard. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333081.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-18018-7
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38. 
Cover image for Laser-Assisted Fabrication of Materials
Laser-Assisted Fabrication of Materials
Author 
Majumdar, Jyotsna Dutta. editor. Manna, Indranil. editor. SpringerLink (Online service)
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ONLINE(333178.1)
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http://dx.doi.org/10.1007/978-3-642-28359-8
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39. 
Cover image for Dynamics of Gas-Surface Interactions Atomic-level Understanding of Scattering Processes at Surfaces
Dynamics of Gas-Surface Interactions Atomic-level Understanding of Scattering Processes at Surfaces
Author 
Díez Muiño, Ricardo. editor. Busnengo, Heriberto Fabio. editor. SpringerLink (Online service)
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ONLINE(333638.1)
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http://dx.doi.org/10.1007/978-3-642-32955-5
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40. 
Cover image for Liquid Crystalline Semiconductors Materials, properties and applications
Liquid Crystalline Semiconductors Materials, properties and applications
Author 
Bushby, Richard J. editor. Kelly, Stephen M. editor. O'Neill, Mary. editor. SpringerLink (Online service)
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ONLINE(335654.1)
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http://dx.doi.org/10.1007/978-90-481-2873-0
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41. 
Cover image for Homogeneous Catalysis with Metal Complexes Fundamentals and Applications
Homogeneous Catalysis with Metal Complexes Fundamentals and Applications
Author 
Duca, Gheorghe. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-642-24629-6
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42. 
Cover image for Mass Metrology
Mass Metrology
Author 
Gupta, S. V. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-23412-5
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43. 
Cover image for GaN and ZnO-based Materials and Devices
GaN and ZnO-based Materials and Devices
Author 
Pearton, Stephen. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-23521-4
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44. 
Cover image for Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces
Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces
Author 
Sadewasser, Sascha. editor. Glatzel, Thilo. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-22566-6
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45. 
Cover image for Atom Probe Microscopy
Atom Probe Microscopy
Author 
Gault, Baptiste. author. Moody, Michael P. author. Cairney, Julie M. author. Ringer, Simon P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-3436-8
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46. 
Cover image for Nanophenomena at Surfaces Fundamentals of Exotic Condensed Matter Properties
Nanophenomena at Surfaces Fundamentals of Exotic Condensed Matter Properties
Author 
Michailov, Michail. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-16510-8
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47. 
Cover image for Coherent Light Microscopy Imaging and Quantitative Phase Analysis
Coherent Light Microscopy Imaging and Quantitative Phase Analysis
Author 
Ferraro, Pietro. editor. Wax, Adam. editor. Zalevsky, Zeev. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-642-15813-1
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48. 
Cover image for Multifunctional Polycrystalline Ferroelectric Materials Processing and Properties
Multifunctional Polycrystalline Ferroelectric Materials Processing and Properties
Author 
Pardo, Lorena. author. Ricote, Jesús. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-2875-4
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